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Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements

Published

Author(s)

D. Khera, Loren W. Linholm, Richard A. Allen, Michael W. Cresswell, V. C. Tyree, W. Hansford, C. Pina
Proceedings Title
Proc., IEEE International Conference on Microelectronic Test Structures
Conference Dates
March 18-20, 1991
Conference Location
Kyoto, 1, JA

Citation

Khera, D. , Linholm, L. , Allen, R. , Cresswell, M. , Tyree, V. , Hansford, W. and Pina, C. (1991), Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements, Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA (Accessed March 1, 2024)
Created December 30, 1991, Updated October 12, 2021