Khera, D.
, Linholm, L.
, Allen, R.
, Cresswell, M.
, Tyree, V.
, Hansford, W.
and Pina, C.
(1991),
Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements, Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA
(Accessed May 2, 2024)
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Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements
Published
Author(s)
D. Khera, , , , V. C. Tyree, W. Hansford, C. Pina
Proceedings Title
Proc., IEEE International Conference on Microelectronic Test Structures
Conference Dates
March 18-20, 1991
Conference Location
Kyoto, 1, JA
Pub Type
Conferences
Citation
Created December 30, 1991, Updated October 12, 2021