TY  - CONF
AU  - D. Khera
AU  - Loren Linholm
AU  - Richard Allen
AU  - Michael Cresswell
AU  - V. Tyree
AU  - W. Hansford
AU  - C. Pina
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA
PY  - 1991
TI  - Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements
ER  -