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Displaying 56426 - 56450 of 74222

Coaxial Line-Reflect-Match Calibration

October 1, 1995
Author(s)
Jeffrey A. Jargon, Roger Marks, Dylan F. Williams
We describe a coaxial line-reflect-match calibration that corrects for imperfections in the load used as a match standard. The method provides a practical means of obtaining accurate, wideband calibrations with compact coaxial standard sets. When our load

Elastic Properties of Particle-Occlusion Composites: Measurements and Modeling

October 1, 1995
Author(s)
H M. Ledbetter, S K. Datta, Martin Dunn
We review some of our recent studies on the effective elastic constants of composites where the occluded phase is spherical or spheroidal (oblate or prolate). From constituent properties and phase geometry, we estimated the composites effective macroscopic

Electrical Measurements of Microwave Flip-Chip Interconnections

October 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We apply custom calibration standards and software to the accurate on-wafer measurement of components on flip-chip coplanar-waveguide MM ICs. We characterize transmission lines, M IM capacitors, and spiral inductors and develop equivalent circuit

Guidelines for the Development of Mapping Tables

October 1, 1995
Author(s)
Allison Barnard Feeney, D Craig
The Standard for the Exchange of Product Model Data (STEP) is being developed under the auspices of the International Organization for Standardization (ISO) Technical Committee 184 (SC4). A principle feature of the STEP architecture is that it has two

Ouch Those Programs are Painful

October 1, 1995
Author(s)
Don E. Libes
Expect is a program to control interactive applications. These applications interactively prompt and expect auser to enter keystrokes in response. By using Expect, you can write simple scripts to automate theseinteractions. And using automated interactive

Self-focused Light Propagation in a Fully Saturable Medium: Theory

October 1, 1995
Author(s)
Marla L. Dowell, B D. Paul, Alan Gallagher, J W. Cooper
We report observations of self-focusing and filamentation of ~3 ns laser pules in strontium (Sr) vapor. The expermental arrangement consits of a Sr vapor cell and a pulsed Nd:YAG pumped dye laser tuned to the blue of the 461 nm transition in Sr. The

Simulation and Implementation of an Open Architecture Controller

October 1, 1995
Author(s)
Frederick M. Proctor, William P. Shackleford, Charles W. Yang
The National Institute of Standards and Technology (NIST) has developed a modular definition of components for machine control, and a specification to their interfaces, with broad application to robots, machine tools, and coordinate measuring machines

The NIST SIMA Interactive Management Workshop

October 1, 1995
Author(s)
Clarence Johnson, Simon P. Frechette, Mark E. Luce
The Manufacturing Systems Integration Division (MSID) hosted a workshop November 14-16, 1994, on Systems Integration for Manufacturing Applications (SIMA). The workshop was held at the Defense Systems Management College (DSMC) in Fort Belvoir, Virginia. A
Displaying 56426 - 56450 of 74222
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