Chandler-Horowitz, D.
, Berning, D.
, Pellegrino, J.
, Burnett, J.
, Amirtharaj, P.
, Bour, D.
and Treat, D.
(1995),
Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures, Semiconductor Characterization - Present Status and Future Needs, Gaithersburg, MD, USA
(Accessed December 14, 2024)
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Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures
Published
Author(s)
, , Joseph G. Pellegrino, John H. Burnett, , D. P. Bour, D. W. Treat
Proceedings Title
Semiconductor Characterization - Present Status and Future Needs
Conference Location
Gaithersburg, MD, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1995, Updated October 12, 2021