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Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures

Published

Author(s)

Deane Chandler-Horowitz, David W. Berning, Joseph G. Pellegrino, John H. Burnett, Paul M. Amirtharaj, D. P. Bour, D. W. Treat
Proceedings Title
Semiconductor Characterization - Present Status and Future Needs
Conference Location
Gaithersburg, MD, USA

Citation

Chandler-Horowitz, D. , Berning, D. , Pellegrino, J. , Burnett, J. , Amirtharaj, P. , Bour, D. and Treat, D. (1995), Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures, Semiconductor Characterization - Present Status and Future Needs, Gaithersburg, MD, USA (Accessed June 19, 2024)

Issues

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Created December 30, 1995, Updated October 12, 2021