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A Comparison of Techniques for Nondestructive Composition Measurements in Cd1-xZnxTe Substrates

Published

Author(s)

S. P. Tobin, J. P. Tower, P. W. Norton, Deane Chandler-Horowitz, Paul M. Amirtharaj, V. C. Lopes, William Duncan, A. J. Syllaios, C. K. Ard, N. C. Giles, R. Balasubramanian, A. B. Bollong, T. W. Steiner, E. D. Bowen, B. K. Tanner
Citation
Journal of Electronic Materials
Volume
24
Issue
5

Citation

Tobin, S. , Tower, J. , Norton, P. , Chandler-Horowitz, D. , Amirtharaj, P. , Lopes, V. , Duncan, W. , Syllaios, A. , Ard, C. , Giles, N. , Balasubramanian, R. , Bollong, A. , Steiner, T. , Bowen, E. and Tanner, B. (1995), A Comparison of Techniques for Nondestructive Composition Measurements in Cd<sub>1-x</sub>Zn<sub>x</sub>Te Substrates, Journal of Electronic Materials (Accessed April 17, 2024)
Created December 30, 1995, Updated October 12, 2021