Tobin, S.
, Tower, J.
, Norton, P.
, Chandler-Horowitz, D.
, Amirtharaj, P.
, Lopes, V.
, Duncan, W.
, Syllaios, A.
, Ard, C.
, Giles, N.
, Balasubramanian, R.
, Bollong, A.
, Steiner, T.
, Bowen, E.
and Tanner, B.
(1995),
A Comparison of Techniques for Nondestructive Composition Measurements in Cd<sub>1-x</sub>Zn<sub>x</sub>Te Substrates, Journal of Electronic Materials
(Accessed April 24, 2024)
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A Comparison of Techniques for Nondestructive Composition Measurements in Cd1-xZnxTe Substrates
Published
Author(s)
S. P. Tobin, J. P. Tower, P. W. Norton, , , V. C. Lopes, , A. J. Syllaios, C. K. Ard, N. C. Giles, R. Balasubramanian, A. B. Bollong, T. W. Steiner, E. D. Bowen, B. K. Tanner
Citation
Journal of Electronic Materials
Volume
24
Issue
5
Pub Type
Journals
Citation
Created December 30, 1995, Updated October 12, 2021