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A Comparison of Techniques for Nondestructive Composition Measurements in Cd1-xZnxTe Substrates
Published
Author(s)
S. P. Tobin, J. P. Tower, P. W. Norton, Deane Chandler-Horowitz, Paul M. Amirtharaj, V. C. Lopes, William Duncan, A. J. Syllaios, C. K. Ard, N. C. Giles, R. Balasubramanian, A. B. Bollong, T. W. Steiner, E. D. Bowen, B. K. Tanner
Citation
Journal of Electronic Materials
Volume
24
Issue
5
Pub Type
Journals
Citation
Tobin, S.
, Tower, J.
, Norton, P.
, Chandler-Horowitz, D.
, Amirtharaj, P.
, Lopes, V.
, Duncan, W.
, Syllaios, A.
, Ard, C.
, Giles, N.
, Balasubramanian, R.
, Bollong, A.
, Steiner, T.
, Bowen, E.
and Tanner, B.
(1995),
A Comparison of Techniques for Nondestructive Composition Measurements in Cd<sub>1-x</sub>Zn<sub>x</sub>Te Substrates, Journal of Electronic Materials
(Accessed October 15, 2025)