U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 47251 - 47275 of 74167

Wavelength References for Wavelength Division Multiplexing

January 1, 2001
Author(s)
Sarah L. Gilbert, Tasshi Dennis, William C. Swann
We describe NIST research on wavelength standards for optical fiber communications. We have developed transfer standrds that can be used to calibrate instruments in the 1510-1560 nm region and a investigating references for other regions.

Wavelength standards for optical communications

January 1, 2001
Author(s)
Sarah L. Gilbert, William C. Swann, Tasshi Dennis
We review wavelength accuracy and calibration issues for wavelength division multiplexed (WDM) optical fiber communication and describe our work on wavelength calibration references. We have developed wavelength references for National Institute of

Window-Based Applications of TRC Databases: Structure and Internet Distribution

January 1, 2001
Author(s)
X. Yan, Qian Dong, Michael D. Frenkel, K. R. Hall
Thermophysical and thermochemical property data on organic compounds provide vital background information for scientific and engineering communities in both academic and industrial environments. The Thermodynamics Research Center (TRC) has collected an

Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples

January 1, 2001
Author(s)
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek
Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in some plasma etch processes, to near room temperature for soft bakes of resists, to 500 C for

A Mo-Cu Superconducting Transition-Edge Microcalorimeter with 4.5 eV Energy Resolution at 6 keV

December 31, 2000
Author(s)
Kent D. Irwin, Gene C. Hilton, John M. Martinis, Steven Deiker, Norman F. Bergren, Sae Woo Nam, David A. Rudman, David A. Wollman
We describe a superconducting transition-edge microcalorimeter with an energy resolution of 4.5 1 0.1 eV full-width at half-maximum (FWHM) for Mn Kα X-rays from an 55Fe source. The thermometer consists of a photolithographically patterned Mo-Cu

A Novel Method for Fabricating CD Reference Materials with 100 nm Linewidths

December 31, 2000
Author(s)
Richard A. Allen, Loren W. Linholm, Michael W. Cresswell, Colleen E. Hood
A technique has been developed to fabricate 100-nm CD reference features with I-line lithography by utilizing a unique characteristic of single-crystal silicon-on-insulator films: Under certain etch conditions, the edges of features align to

MEMS Standardization

December 31, 2000
Author(s)
Michael Gaitan
Standardization and metrology are critical infrastructure needs for the MEMS industry. These needs incluse standard test structures and test methods, and standard reference materials. In addition to this, new protocols to disseminate standards and test
Displaying 47251 - 47275 of 74167
Was this page helpful?