U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 45976 - 46000 of 73994

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams
There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single- frequency lasers (frequency-domain) and the short pulse from a mode-locked laser (time-domain). While

How to Succeed at High Speed Machining

March 1, 2001
Author(s)
Matthew A. Davies, Tony L. Schmitz, Brian S. Dutterer
This article summarizes the experiences at NIST in High Speed Machining (HSM) over the past four years. It is a general, non-technical article that describe the issues that must be considered on the shop floor to successfully implement HSM. Several example

Hysteresis in Transport Critical-Current Measurements of Oxide Superconductors

March 1, 2001
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We have investigated magnetic hysteresis in transport critical-current (I c) measurements of Ag-matrix (Bi, Pb) 2Sr 2Ca 2Cu 3O 10-x (Bi-2223) and AgMg-matrix Bi 2Sr 2CaCu 2O 8+x (Bi-22-2212) tapes. I c hysteresis causes measurements with field, angle, and

Implications and Ramifications of Model-Driven Architecture

March 1, 2001
Author(s)
David W. Flater
The Object Management Group (the consortium that issues the Common Object Request Broker Architecture and Unified Modeling Language standards) is making the transition from a standards architecture in which only interface definitions are normative to one

Introduction to ISO 10303 - the STEP Standard for Product Data Exchange

March 1, 2001
Author(s)
Mike Pratt
Since 1984 the International Organization for Standardization (ISO)has been working on the development of a comprehensive standard for the electronic exchange of product data between computer-based product life-cycle systems. Initial concentration has been

Jim Zimmerman and the SQUID

March 1, 2001
Author(s)
Richard L. Kautz
The career of Jim Zimmerman, beginning with a solid foundation in electronics and cryogenics, reached a turning point in 1965 when he became coinventor of the rf SQUID (Superconducting Quantum Interference Device), while working at the Scientific

Laser Scanning for Construction Metrology

March 1, 2001
Author(s)
Geraldine S. Cheok, William C. Stone, Robert R. Lipman, Christoph J. Witzgall, Javier Bernal
This paper summarizes work at the National Institute of Standards and Technology (NIST) in the Non-Intrusive Scanning Technologies for Construction Assessment Project. It will briefly describe the initial proof-of-concept phase of this project, the

Laser-Excited Hot-Electron Induced Desorption

March 1, 2001
Author(s)
John William Gadzuk
The history and technical highlights leading up to and following the publication of a classic NIST publication on the theory and experiments involving optical-laser induced desorption of adsorbed NO from metal surfaces is presented.

Mechanical Properties of High-Strength Concrete at Elevated Temperatures

March 1, 2001
Author(s)
Long T. Phan, Nicholas J. Carino
This report describes results of NIST's experimental program that focuses on effects of elevated temperature exposure on mechanical properties of hing strength concrete (HSC). Mechanical properties were measured by heating, with and without preload, the

Mechanisms and Measurement of Oxidative Damage to DNA

March 1, 2001
Author(s)
M. Dizdaroglu, Pawel Jaruga, H Rodriguez
Free radicals are produced in cells by normal metabolism and by exogenous sources. These species cause oxidative damage to DNA and generate multiple products including modified bases and sugars, strands breaks and DNA-protein crosslinks by a variety of

Meta-Analysis of Face Recognition Algorithms

March 1, 2001
Author(s)
P J. Phillips, E M. Newton
To obtain a quantitative assessment of the state of automatic face recognition, we performed a meta-analysis of performance results of face recognition algorithms in the literature. The analysis was conducted on 24 papers that report identification

Metrology for Non-Contact Rainbow Thermometry

March 1, 2001
Author(s)
Cary Presser
NIST recently acquired a commercially available, state-of-the-art droplet diagnostic system that determines the size, velocity, and temperature of in-flight individual droplets. This non-contact diagnostic will be used to determine droplet characteristics

Microfabricated Transition-Edge X-ray Detectors

March 1, 2001
Author(s)
Gene C. Hilton, John M. Martinis, Kent D. Irwin, Norman F. Bergren, David A. Wollman, Martin Huber, Sae Woo Nam
We are developing high performance x-ray detectors based on superconducting transition-edge sensors (TES) for application in materials analysis and astronomy. Using our recently developed fully lithographic TES fabrication process, we have made devices

Model of a Fiber-Optic Evanescent-Wave Fluorescence Sensor

March 1, 2001
Author(s)
D L. Woerdeman, Richard~undefined~undefined~undefined~undefined~undefined Parnas
A fiber-optic cure sensor based on evanescent wave fluorescence spectroscopy has been designed to probe the interphase region of glass-reinforced composites. The size of the interphase can vary significantly, d epending on the exact nature of the fiber

Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles

March 1, 2001
Author(s)
A Liu, A Rahmani, Garnett W. Bryant, Lee J. Richter, Stephan J. Stranick
We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An external

Nanoindentation of Polymers: An Overview

March 1, 2001
Author(s)
Mark R. VanLandingham, John S. Villarrubia, William F. Guthrie, G F. Meyers
Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing
Displaying 45976 - 46000 of 73994
Was this page helpful?