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Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope

Published

Author(s)

B -. Du, Mark R. VanLandingham, Q Zhang, T -. He

Abstract

Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe, the plowing friction will add another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction and the coefficient of plowing friction during nanoscratch testing. Also, by combining nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured.
Citation
Journal of Materials Research
Volume
16
Issue
No. 5

Keywords

atomic force microscopy, diamond-tipped probe, nanoscale mechanics

Citation

Du, B. , VanLandingham, M. , Zhang, Q. and He, T. (2001), Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope, Journal of Materials Research, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860289 (Accessed July 22, 2024)

Issues

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Created May 1, 2001, Updated February 19, 2017