Electron Transport, Ionization, and Attachment Coefficients in C2F4 and C2F4/Ar Mixtures

Published

May 1, 2001

Author(s)

Amanda N. Goyettes, G. de Hann, Yicheng Wang, Loucas G. Christophorou, James K. Olthoff

Abstract

This is a summary report of the paper to be published in the Journal of Chemical Physics. Measurements of electron transport, effective ionization, and attachment coefficients are reported for C₂F₄. In addition, measurements of the electron drift velocity and the effective ionization coefficient as a function of the density-reduced electric field E/N are reported for mixtures of C₂F₄ with Ar. The measured effective ionization coefficients in C₂F₄/Ar mixtures indicate a contribution to these coefficients from Penning ionization at high Ar concentrations. The rate constant for electron attachment to C₂F₄ as well as the product of the longitudinal electron diffusion coefficient and the gas number density NDL in mixtures of C₂F₄ with Ar as functions of E/N are also reported.

Citation

J. Chemical Physics (publ. Amer. Inst. of Physics)

Volume

114

Issue

20

Pub Type

Journals

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Keywords

C₂F₄, drift velocity, electron attachment, electron transport coefficients, ionization

Citation

Goyettes, A. , de Hann, G. , Wang, Y. , Christophorou, L. and Olthoff, J. (2001), Electron Transport, Ionization, and Attachment Coefficients in C₂F₄ and C₂F₄/Ar Mixtures, J. Chemical Physics (publ. Amer. Inst. of Physics), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8575 (Accessed October 10, 2025)