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Displaying 45876 - 45900 of 143775

Deembedding parasitic elements of GaN nanowire MESFETs by use of microwave measurements

June 3, 2011
Author(s)
Dazhen Gu, Thomas M. Wallis, Paul T. Blanchard, SangHyun S. Lim, Atif A. Imtiaz, Kristine A. Bertness, Norman A. Sanford, Pavel Kabos
We present a deembedding roadmap for extracting parasitic elements of a nanowire (NW) MESFET device from full two-port scattering-parameter measurements in the frequency range from 0.1 GHz to 25 GHz. The NW MESFET is integrated in a microwave coplanar

Interlaboratory Reproducibility of Size and Surface Charge Measurements on Nanoparticles prior to Biological Impact Assessment

June 3, 2011
Author(s)
Gert Roebben, Sonia Ramirez-Garcia, Vincent A. Hackley, Matthias Roesslein, Fred Klaessig, Vikram Kestens, Iseult Lynch, C. M. Garner, Alan Rawle, Allison Elder, Vicky Colvin, Wolfgang Kreyling, Harald Krug, Zuzanna Lewicka, Scott McNeil, Andre Nel, Anil K. Patri, Peter Wick, Tian Xia, Guenther Oberdoerster, Kenneth Dawson
The International Alliance for NanoEHS Harmonization (IANH) organises interlaboratory comparisons of methods relevant for a better understanding of the biological impacts of nano-objects, to highlight and remove sources of irreproducibility in existing

Numerical test of few-qubit clock protocols

June 3, 2011
Author(s)
Till P. Rosenband
The stability of several clock protocols based on 2 to 20 entangled atoms is evaluated numerically, by a simulation that includes the effect of decoherence due to classical oscillator noise. In this context the squeezed states proposed by Andre, Sorensen

Observing the average trajectories of single photons in a two-slit interferometer

June 3, 2011
Author(s)
Sacha Kocsis, Boris Braverman, Sylvain Ravets, Martin Stevens, Richard Mirin, L. Krister Shalm, Aephraim M. Steinberg
A consequence of the quantum mechanical uncertainty principle is that one may not discuss the path or "trajectory" that a quantum particle takes, because any measurement of position irrevocably disturbs the momentum, and vice versa. Using weak measurements

Three-dimensional imaging of liquid crystal structures and defects by means of holographic manipulation of colloidal nanowires with faceted sidewalls

June 3, 2011
Author(s)
David Engstrom, Martin Persson, Rahul P. Trivedi, Kristine A. Bertness, Mattias Goksor, Ivan I. Smalyukh
We use nanowires with faceted sidewalls for mapping of the patterns of three-dimensional orientational order and defect structures. In chiral nematics, the nanowires follow the local average orientation of rod-shaped molecules. When spatially translated by

Statistical Methods for Analyzing Color Differences

June 2, 2011
Author(s)
Maria E. Nadal, Carl C. Miller, Hugh Fairman
Multi-valued measurands, such as spectral reflectance or transmission, tristimulus values, are usually analyzed by reducing the data to a single-valued parameter, such as color difference. The variations of sets of color differences are non-normal

A Physics-Based Simple Series Resistance Extraction Methodology

June 1, 2011
Author(s)
Kin P. Cheung, Jason P. Campbell
Series resistance has become a serious obstacle encountered in the development of advanced CMOS devices. At the same time, series resistance quantification in these same advanced CMOS devices is a difficult challenge. In this study, we demonstrate a very

Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares

June 1, 2011
Author(s)
Aaron A. Urbas, Steven J. Choquette
A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situations

Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission

June 1, 2011
Author(s)
Sung Kim, Edward E. Kuester, Christopher L. Holloway, James R. Baker-Jarvis, Aaron D. Scher
This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here
Displaying 45876 - 45900 of 143775
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