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Ceramic Thin Film Measurements and Standards Program Web Page

Published

Author(s)

Charles E. Bouldin, Debra Kaiser, Peter K. Schenck

Abstract

Ceramic materials are increasingly being used in thin film form in electronic, optical, optoelectronic, and magnetic devices. Our program addresses measurements, standards and data needs for a wide variety of application areas, including III-V andIII-nitride optoelectronic devices, ferroelectric memories, and thermal barrier coatings components.Descriptions of the measurement and fabrication activities and tools are classified under Materials, Techniques and Properties. Detailed, programmatic project descriptions are given in the Annual Report. Some recent publications from the thin film program are available in PDF format.
Citation
Electronic Publication

Keywords

ceramic, data, measurements, publication links, software links, standards, thin films

Citation

Bouldin, C. , Kaiser, D. and Schenck, P. (2001), Ceramic Thin Film Measurements and Standards Program Web Page, Electronic Publication, [online], None (Accessed May 26, 2024)

Issues

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Created January 31, 2001, Updated October 12, 2021