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NIST Authors in Bold

Displaying 45851 - 45875 of 143775

Thermal Conductivity of Gases

June 6, 2011
Author(s)
Marcia L. Huber, Allan H. Harvey
Tables of thermal conductivity of common gases as a function of temperature

Throughput and Delay Analysis of Half-Duplex IEEE 802.11 Mesh Networks

June 6, 2011
Author(s)
Camillo A. Gentile
Emerging technologies for mesh networks can provide users with last-mile service to an access point by forwarding data through wireless relays instead of through expensive wireline infrastructure. While an extensive amount of literature on mesh networks

Traceable Calibration of a Critical Dimension Atomic Force Microscope

June 6, 2011
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Craig D. McGray, Jon C. Geist
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NIST C-AFM

Viscosity of Gases

June 6, 2011
Author(s)
Marcia L. Huber, Allan H. Harvey
Tables of recommended values for the viscosity of common gases as a function of temperature.

CAVITY OPTOMECHANICAL SENSORS

June 5, 2011
Author(s)
Houxun H. Miao, Kartik A. Srinivasan, Matthew T. Rakher, Marcelo I. Davanco, Vladimir A. Aksyuk
We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality factor

Modelling Dynamic Aerosol Processes for Indoor Ultrafine Particles

June 5, 2011
Author(s)
Dong H. Rim, Lance L. Wallace, Andrew K. Persily, Jung I. Choi
This study has investigated aerosol transformation processes for four common sources of indoor ultrafine particles (UFP): gas stove, electric stove, candle, and hair dryer. For each of the four UFP sources, the temporal change in particle size distribution

Ultrafine Particles: 3 Years of Measurements in the NIST Test House

June 5, 2011
Author(s)
Lance L. Wallace, Andrew K. Persily, Steven J. Emmerich, Dong H. Rim, Chi P. Hoang, Cynthia H. Reed, Wang Fang, M E. Greene, Jung I. Choi
NIST has supported research characterizing ultrafine particle sources and dynamics for more than a decade. Over 90 % of ultrafine particles (UFP) produced by stovetop cooking on both gas and electric stoves were 10 nm. Using the NIST test house

Volatile Organic Compound Concentrations and Estimation of Optimal Source Strengths to Achieve a High Level of Acceptance Indoors using Multi- Zone Simulation

June 5, 2011
Author(s)
Helena Jarnstrom, William Stuart Dols, Cynthia H. Reed, Andrew K. Persily
This study investigated the possibility of identifying chemical pollutant profiles and concentration levels that result in a high level of acceptance indoors. In addition, a multi-zone simulation tool, CONTAM, developed by the National Institute of

Deembedding parasitic elements of GaN nanowire MESFETs by use of microwave measurements

June 3, 2011
Author(s)
Dazhen Gu, Thomas M. Wallis, Paul T. Blanchard, SangHyun S. Lim, Atif A. Imtiaz, Kristine A. Bertness, Norman A. Sanford, Pavel Kabos
We present a deembedding roadmap for extracting parasitic elements of a nanowire (NW) MESFET device from full two-port scattering-parameter measurements in the frequency range from 0.1 GHz to 25 GHz. The NW MESFET is integrated in a microwave coplanar
Displaying 45851 - 45875 of 143775
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