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NIST Authors in Bold

Displaying 45826 - 45850 of 73697

Evanescent-Wave Cavity Ring-down Spectroscopy for Trace Water Detection

February 1, 2001
Author(s)
A C. Pipino, Joseph T. Hodges
We explore the use of evanescent wave cavity ring-down spectroscopy (EW-CRDS) for water detection through a signal-to-noise ratio analysis. Cavity ring-down spectroscopy (CRDS) is an emerging optical absorption technique that employs the mean photon decay

Exploring a Quantum Degenerate Fermi Gas

February 1, 2001
Author(s)
Deborah S. Jin, B. L. DeMarco, S Papp
We discuss the production and study of a quantum degenerate Fermi gas of atoms. The fundamental difficulty in cooling a gas of fermionic atoms is the lack of rethermalizing collisions in a spin-polarized sample. We overcome this difficulty using

Exploring Site Quality Above 1 GHz Using Double Ridged Horns

February 1, 2001
Author(s)
Dennis G. Camell, Robert T. Johnk, K. R. Hall
This is a summary of recent exploratory efforts conducted by the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub-Committee 1,working group 1-13.2 on site requirements for radiated measurements above 1GHz. The main

Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films

February 1, 2001
Author(s)
Ryna B. Marinenko, J T. Armstrong, Debra L. Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin
Barium strontium titanate (BST) thin films of varying composition and thickness (5nm to 400nm) on (100)Si or Pt/(100)Si substrates were measured using an electron microprobe analyzer with wavelength dispersive x-ray spectrometers. Most of the films were

Fabrication, Derivatization and Applications of Plastic Microfluidic Devices

February 1, 2001
Author(s)
S L. Barker, Michael J. Tarlov, David J. Ross, T J. Johnson, E A. Waddell, Laurie E. Locascio
Control of the polymer surface chemistry is a crucial aspect of development of plastic microfluidic devices. When commercially available plastic substrates are used to fabricate microchannels, differences in the electroosmotic flow mobility (EOF) from

Fiber Optic Flow and Cure Sensing for Liquid Composite Molding

February 1, 2001
Author(s)
Joy P. Dunkers, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, S R. Kueh, J H. VanZanten, S G. Advani, Richard~undefined~undefined~undefined~undefined~undefined Parnas
The Polymer Composites group at the National Institute of Standards and Technology has efforts in both on-line flow and cure sensing for liquid composite molding. For our flow program, a novel fiber optic real time sensor system has been developed that can

Fire Emulator/Detector Evaluator: Design, Operation, and Performance (NIST SP 965)

February 1, 2001
Author(s)
Thomas G. Cleary, Michelle K. Donnelly, William L. Grosshandler
This paper describes the fire emulator/detector evaluator which was developed by NIST. The FE/DE has proven to be a very flexible design. The main function of the device is to reproduce the environment (temperature, air velocity, aerosol and gas species

Formation of Macropores in Calcium Phosphate Cement Implants

February 1, 2001
Author(s)
Shozo Takagi, Laurence C. Chow
A calcium phosphate cement (CPC) was shown to harden at ambient temperatures and form hydroxyapatite as the only end-product. Animal study results showed showed that CPC resorbed slowly and was replaced by new bone. For some clinical applications, it would

Frontiers of Analytical Metrology for the Silicon Semiconductor Industry

February 1, 2001
Author(s)
Thomas J. Shaffner, David G. Seiler
The grand challenges of the National Technology Roadmap for Semiconductors include affordable scaling, new materials and structures, and yield and reliability. While these encapsulate the high-level perspective and needs of the industry as a whole, there

Gate Oxide Formation under Mild Conditions for Scanning Capacitance Microscopy

February 1, 2001
Author(s)
Duncan McBride, Joseph Kopanski
Scanning Capacitance Microscopy (SCM) can be used to measure doping density in silicon with a spatial resolution of about 10 nm. In order to make such measurements on fabricated devices, the device must be cross-sectioned, and an oxide sufficient to form a

How Interoperability Saves Money

February 1, 2001
Author(s)
Robert E. Chapman
The pressures of competing in the global marketplace are forcing building control companies, equipment and systems manufacturers, energy providers, utiliites, and design engineers to improve performance and reduce costs. One means of meeting this twin

Information Technology Measurement and Testing Activities at NIST

February 1, 2001
Author(s)
David Flater, James E. Fowler, Simon P. Frechette, Craig M. Shakarji, Michael Hogan, Shirley M. Radack, Douglas Montgomery, L Johnson, R Rosenthal, R Mccabe, R Carpenter, Lisa Carnahan, M M. Gray
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society
Displaying 45826 - 45850 of 73697
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