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NIST Authors in Bold

Displaying 45801 - 45825 of 73697

Assurance Hierarchies in B2C Electronic Commerce

February 1, 2001
Author(s)
Gordon E. Lyon, Hai C. Tang
Electronic commerce (e-commerce) is defined as a broad, interdisciplinary field addressing the automation of business practices via open, globally spanning, Internet public access. E-commerce shows great promise in improving the efficiency of current

Capillary Electrophoresis as a Tool for Optimization of Multiplex PCR Reactions

February 1, 2001
Author(s)
John M. Butler, C M. Ruitberg, Peter M. Vallone
Copying multiple regions of a DNA molecule is routinely performed today using the polymerase chain reaction (PCR) in a process commonly referred to as multiplex PCR. The development of a multiplex PCR reaction involves designing primer sets and examining

Ceramic Thin Film Measurements and Standards Program Web Page

February 1, 2001
Author(s)
Charles E. Bouldin, Debra Kaiser, Peter K. Schenck
Ceramic materials are increasingly being used in thin film form in electronic, optical, optoelectronic, and magnetic devices. Our program addresses measurements, standards and data needs for a wide variety of application areas, including III-V andIII

Characterization of Coating System Interphases with Phase Imaging AFM

February 1, 2001
Author(s)
Tinh Nguyen, Xiaohong Gu, Mark R. VanLandingham, M Giraud, R Dutruc-Rosset, R Ryntz, D Nguyen
The interphase between a polymer film and a substrate controls the adhesion and durability of a variety of polymeric systems including adhesives, coatings on plastics and metals, and electronic packaging. A polymeric coating system consists of a coating

Characterization of Coating System Interphases With Phase Imaging AFM.

February 1, 2001
Author(s)
Tinh Nguyen, Xiaohong Gu, M Giraud, M R. VanLandingham, R Dutruc-Rosset, R Ryntz, D Nguyen
The interphase between a polymer film and a substrate controls the adhesion and durability of a variety of polymeric systems including adhesives and coatings on plastics and metals. Interphase formation is affected by processing conditions that control

Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device

February 1, 2001
Author(s)
John A. Small, David S. Bright
In recent years, field-emission gun scanning electron microscopes, FEG-SEMs, with high-brightness electron guns and excellent performance at low electron beam energies (E 0 less then or equal to 5 keV) have become readily available. Concurrently the

Conical Emission by 2-PS Excitation of Potassium Vapor

February 1, 2001
Author(s)
D Sarkisyan, B D. Paul, S T. Cundiff, E A. Gibson, Alan Gallagher
Conical emission, redshifted from the atomic resonance, is observed when a ~2ps laser beam, blueshifted from resonance, propagates through potassium vapor. In contrast, no cone is visible when a 150-fs pulse is used. The 2-ps pulse-induced cone has a

Constructing Sibson Elements for a Rectangular Mesh

February 1, 2001
Author(s)
David E. Gilsinn
This paper documents the construction of a finite element, called the Sibson element. The shape function of this element is formed on rectangular grids by C 1 splines defined on a triangulation of each subrectangle by dividing it into four subtriangles

Distributed Sensor Fire Detection (NIST SP 965)

February 1, 2001
Author(s)
Thomas G. Cleary, Kathy A. Notarianni
This paper details a case study that utilized model simulations to assess the relative performance benefits of distributed sensing over single-station, single-sensor smoke detection and co-located multi-sensor detection. 500 individual CFAST computer fire

DNA Mass Spectrometry at NIST

February 1, 2001
Author(s)
Peter M. Vallone
The use of mass spectrometry as a tool for solving biochemical problems is growing. Specifically, matrix assisted laser desorption ionization coupled with time-of-flight detection systems (MALDI-TOF) is emerging for high throughput and highaccuracy

Documentary and Physical Standards for Surface Finish and Imperfections

February 1, 2001
Author(s)
Theodore V. Vorburger
Surface finish and imperfections are important properties of optical surfaces because they are caused by manufacturing limitations or defects and are linked to degradation of optical performance. Surface finish or surface roughness constitutes the numerous
Displaying 45801 - 45825 of 73697
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