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Displaying 2001 - 2025 of 2539

Interfacial Ferromagnetism in LaNiO 3 /CaMnO 3 Superlattices

August 21, 2013
Author(s)
A. J. Grutter, H. Yang, Brian Kirby, M. R. Fitzsimmons, J. A. Aguiar, N. D. Browning, C. A. Jenkins, E. Arenholz, V. V. Mehta, U. S. Alaan, Y. Suzuki
We observe interfacial ferromagnetism in superlattices of the paramagnetic metal LaNiO 3 and the antiferromagnetic insulator CaMnO 3. The magnetic behavior can be explained in terms of an interfacial double exchange mechanism in which itinerant electrons

Gaps Analysis for CD Metrology Beyond the 22 nm Node

April 10, 2013
Author(s)
Benjamin D. Bunday, Thomas Germer, Victor H. Vartanian, Aaron Cordes, Aron Cepler, Charles Settens
… (OCD) metrology and new potential solutions such as He-ion microscopy (HeIM), CD atomic force microscopy (CD-AFM), …

Vapor Phase Metal-assisted Chemical Etching of Silicon

March 14, 2013
Author(s)
Owen J. Hildreth, Daniel R. Schmidt
This work introduces and explores Vapor Phase Metal-assisted Chemical Etching (VP-MaCE) of silicon as a method to bypass some of the challenges found in traditional Liquid Phase Metal-assisted Chemical Etching (LP-MaCE). Average etch rates for Ag, Au, and

From Electrons to Infrastructure: Engineering Concrete From The Bottom Up

April 6, 2011
Author(s)
Hamlin M. Jennings, Jeffrey W. Bullard
We argue that only an approach rooted in fundamental, mechanistic models of concrete materials offers a viable path for handling the enormous number of new variables that are being introduced as new materials are added to the design space, and as new

A 10 mK Scanning Probe Microscopy Facility

December 29, 2010
Author(s)
Young J. Song, Alexander F. Otte, Steven R. Blankenship, Alan H. Band, Frank M. Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A. Stroscio
… chambers for metal and semiconductor samples, a field ion microscope for tip characterization, and a fully …

Design of an on-chip microscale nanoassembly system

February 10, 2009
Author(s)
Jason J. Gorman, Yong Sik Kim, Andras Vladar, Nicholas G. Dagalakis
… integration with a Scanning Electron Microscope/Focused Ion Beam (SEM/FIB) instrument are also discussed. …

Temperature Dependence of the Acid Dissociation Constant of the Hydroxyl Radical

November 1, 2002
Author(s)
G A. Poskrebyshev, Pedatsur Neta, Robert E. Huie
The acid dissociation constant of the hydroxyl radical in aqueous solution was determined by pulse radiolysis from the pH dependence of the rate constant for reaction of the OH/O - radical with benzoate ions. The rate constant and the pKa( OH) values were
Displaying 2001 - 2025 of 2539
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