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Metrology

Electrical / electromagnetic metrology

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  • Published Date
Displaying 76 - 100 of 458

Dynamics studies of polarization switching in ferroelectric hafnium zirconium oxide

May 12, 2021
Author(s)
X. Lyu, M. Si, Pragya Shrestha, Kin (Charles) Cheung, P. D. Ye
In this paper, we review the ultrafast direct measurement on the transient ferroelectric polarization switching in hafnium zirconium oxide with crossbar metal-insulator-metal (MIM) structures including materials development, device fabrication, structure

Decision Tree for Key Comparisons

April 27, 2021
Author(s)
Antonio Possolo, Amanda Koepke, David Newton, Michael R. Winchester
This contribution describes a Decision Tree intended to guide the selection of statistical models and data reduction procedures in key comparisons (KCs). The Decision Tree addresses a specific need of the Inorganic Analysis Working Group (IAWG) of the

Evaluations of a Detector-Limited Digital Impedance Bridge

April 6, 2021
Author(s)
Mona Feige, Stephan Schlamminger, Yicheng Wang
We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors. Fluctuations of the source voltages were largely removed through postprocessing of the digitized

Accurate Gain Measurement Technique for Limited Antenna Separations

April 5, 2021
Author(s)
Ben Jamroz, Antonius van den Biggelaar, S J. Geluk, Dylan Williams, A. B. Smolders, U. Johannsen, Laurens A. Bronckers
The Friis equation is often used to determine the gain of antennas but assumes that far-field (FF) conditions are met. For limited antenna separations on the order of the Fraunhofer distance, its use requires a precise estimate of the amplitude centers of

Graphene Quantum Hall Effect Parallel Resistance Arrays

February 2, 2021
Author(s)
Alireza Panna, I Fan Hu, Mattias Kruskopf, Dinesh K. Patel, Dean G. Jarrett, Chieh-I Liu, Shamith Payagala, Dipanjan Saha, Albert Rigosi, David B. Newell, Chi-Te Liang, Randolph Elmquist
As first recognized in 2010, epitaxial graphene on SiC(0001) provides a platform for quantized Hall resistance (QHR) metrology unmatched by other 2D structures and materials. Here we report graphene parallel QHR arrays, with metrologically precise

Correction of the Measured Phase of the Radiation Pattern of Millimeter-Wave Antennas

December 14, 2020
Author(s)
Antonius van den Biggelaar, Ben Jamroz, Dylan Williams, A. B. Smolders, U. Johannsen
The results of a radiation pattern measurement of a WR-28 open-ended waveguide (OEWG) are shown. At higher frequencies, the wavelength becomes shorter, making phase measurements very sensitive to positioning and alignment errors. The lack of symmetry in

Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

December 2, 2020
Author(s)
Hongxuan Guo, Alexander Yulaev, Evgheni Strelcov, Alexander Tselev, Christopher M. Arble, Andras Vladar, John S. Villarrubia, Andrei Kolmakov
The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, making them a suitable probe of ultrathin electrical double layers at solid-liquid electrolyte interfaces. Employing graphene as an electron-transparent

Towards data-driven next-generation transmission electron microscopy

October 26, 2020
Author(s)
Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda K. Petford-Long, Sergei Kalinin, Matthew J. Olszta, Rafal Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang Yang, Renu Sharma, Yingge Du, Ann Chiaramonti Debay, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra D. Taheri
The rapidly evolving field of electron microscopy touches nearly every aspect of modern life, underpinning impactful materials discoveries in applications such as quantum information science, energy, and medicine. As the field enters a new decade, a

Dual Josephson impedance bridge: towards a universal bridge for impedance metrology

October 22, 2020
Author(s)
Frederic Overney, Nathan Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna Fox, Paul Dresselhaus, Samuel Benz
This paper presents a full characterization of a Dual Josephson Impedance Bridge (DJIB) at frequencies up to 80 kHz by using the DJIB to compare the best available impedance standards that are (a) directly traceable to the quantum Hall effect, (b) used as

A fast negative impedance converter for JAWS load compensation

September 10, 2020
Author(s)
Jason Underwood, Stephen Pfeiffer, Geoffrey Palo
For accurate realization of the ac volt, the Josephson Arbitrary Waveform Synthesizer (JAWS) must not be overly loaded by the electrical network in which it is used. The interaction between the on-chip inductance and the stray capacitance in the network

Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL

September 10, 2020
Author(s)
S. Yang, Stefan Cular, Alain Rufenacht, Charles J. Burroughs, Paul Dresselhaus, Samuel Benz, M. N. Ng
Standards and Calibration Laboratory (SCL) setup in 2018 a liquid helium based programmable Josephson voltage standard (PJVS) developed by the National Institute of Standards and Technology (NIST). The system was validated by direct comparison with a NIST

The Next Generation of Current Measurement for Ionization Chambers

September 1, 2020
Author(s)
Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology-quality systems must be precise and stable to 0.1% over many years, and linear from 10^(-14) A

Graphene quantum Hall effect devices for AC and DC resistance metrology

August 28, 2020
Author(s)
Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert Rigosi, Randolph Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort we report on ac quantum Hall measurements of a graphene

Ultrafast waveform metrology: A first international comparison

August 24, 2020
Author(s)
Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes during the last

A Phase Measurement Method to Guarantee the Traceability of the Calibration System

August 1, 2020
Author(s)
Nicholas G. Paulter Jr., Sergio Rapuano, Pasquale Daponte, Luca De Vito, Francesco Picariello, Ioan Tudosa
In this paper, an innovative phase measurement method of sinusoidal signals is presented and a proof-of-concept implementation is demonstrated. The method allows measuring the phase at the output of a high frequency sinewave signal generator, respect to a

Over-The-Air Calibration of a Dual-Beam Dual-Polarized 28-GHz Phased-Array Channel Sounder

July 9, 2020
Author(s)
Sung Yun Jun, Derek Caudill, Jelena Senic, Camillo Gentile, Jack Chuang, Nada T. Golmie
This paper describes an over-the-air calibration procedure for the impulse response of a 28-GHz phased-array antenna channel sounder. The silicon-germanium (SiGe) antenna board is composed from two 8x8 planar arrays; each array can generate a distinct beam

Dual Josephson impedance bridge: towards a universal bridge for impedance metrology

May 19, 2020
Author(s)
Frederic Overney, Nathan Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna Fox, Paul Dresselhaus, Samuel Benz
This paper presents a full characterization of a Dual Josephson Impedance Bridge (DJIB) at frequencies up to 80kHz by using the DJIB to compare the best available impedance standards that are (a) directly traceable to the quantum Hall effect, (b) used as

Advanced Temperature-Control Chamber for Resistance Standards

April 10, 2020
Author(s)
Shamith Payagala, Alireza Panna, Albert Rigosi, Dean G. Jarrett
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard resistors. Despite the high quality of these methods, there still exist inherent limitations to the
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