Ultrafast waveform metrology: A first international comparison

Published

August 24, 2020

Author(s)

Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang

Abstract

We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes during the last two years. An overall good agreement between the different measurement techniques is obtained. However, certain features in the frequency- and time-domain responses are not reproduced by all NMIs, calling for additional studies and comparisons.

Proceedings Title

Conference on Precision Electromagnetic Measurements

Conference Dates

August 24-28, 2020

Conference Location

Denver, CO, US

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/CPEM49742.2020.9191926

Local Download

Keywords

Waveform metrology, photodiodes, electro-optic sampling, ultrashort voltage pulses

Citation

Bieler, M. , Struszewski, P. , Feldman, A. , Jargon, J. , Hale, P. , Gong, P. , Xie, W. , Yang, C. , Feng, Z. , Zhao, K. and Yang, Z. (2020), Ultrafast waveform metrology: A first international comparison, Conference on Precision Electromagnetic Measurements, Denver, CO, US, [online], https://doi.org/10.1109/CPEM49742.2020.9191926, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929616 (Accessed October 10, 2025)