Yang, S.
, Cular, S.
, Rufenacht, A.
, Burroughs, C.
, Dresselhaus, P.
, Benz, S.
and Ng, M.
(2020),
Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL, 2020 Conference on Precision Electromagnetic Measurements (CPEM), Denver, CO, US, [online], https://doi.org/10.1109/CPEM49742.2020.9191745, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929608
(Accessed July 6, 2022)
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Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL
Published
Author(s)
S. Yang, , , , , , M. N. Ng
Abstract
Standards and Calibration Laboratory (SCL) setup in 2018 a liquid helium based programmable Josephson voltage standard (PJVS) developed by the National Institute of Standards and Technology (NIST). The system was validated by direct comparison with a NIST transportable PJVS system at 1.018 V, 4 V, 6 V, 8 V and 10 V. The difference between the systems was within 0.5 nV, with an expanded uncertainty of less than 2.2 nV (k = 2). In this paper, the setup and the results of the direct comparison method are presented.Proceedings Title
2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO, US
Pub Type
Conferences
Download Paper
Keywords
Programmable Josephson voltage standard, quantum voltage measurement, measurement uncertainty, Josephson voltage comparison
Citation
Created September 9, 2020, Updated October 12, 2021