Yang, S.
, Cular, S.
, Rufenacht, A.
, Burroughs, C.
, Dresselhaus, P.
, Benz, S.
and Ng, M.
(2020),
Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL, 2020 Conference on Precision Electromagnetic Measurements (CPEM), Denver, CO, US, [online], https://doi.org/10.1109/CPEM49742.2020.9191745, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929608
(Accessed December 14, 2024)
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Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL
Published
Author(s)
S. Yang, , , , , , M. N. Ng
Abstract
Standards and Calibration Laboratory (SCL) setup in 2018 a liquid helium based programmable Josephson voltage standard (PJVS) developed by the National Institute of Standards and Technology (NIST). The system was validated by direct comparison with a NIST transportable PJVS system at 1.018 V, 4 V, 6 V, 8 V and 10 V. The difference between the systems was within 0.5 nV, with an expanded uncertainty of less than 2.2 nV (k = 2). In this paper, the setup and the results of the direct comparison method are presented.Proceedings Title
2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO, US
Pub Type
Conferences
Download Paper
Keywords
Programmable Josephson voltage standard, quantum voltage measurement, measurement uncertainty, Josephson voltage comparison
Citation
Issues
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Created September 9, 2020, Updated October 12, 2021