Graphene quantum Hall effect devices for AC and DC resistance metrology
Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert F. Rigosi, Randolph E. Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a new contact design approach.
2020 Conference on Precision Electromagnetic Measurements(CPEM 2020)
electrical measurement standards, ac quantized Hall resistance, epitaxial graphene
, Patel, D.
, Liu, C.
, Rigosi, A.
, Elmquist, R.
, Wang, Y.
, Bauer, S.
, Yin, Y.
, Pierz, K.
, Pesel, E.
, Goetz, M.
and Schurr, J.
Graphene quantum Hall effect devices for AC and DC resistance metrology, 2020 Conference on Precision Electromagnetic Measurements(CPEM 2020), Denver, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929635
(Accessed June 21, 2021)