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PUBLICATIONS

Graphene quantum Hall effect devices for AC and DC resistance metrology

Published

Author(s)

Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert Rigosi, Randolph Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr

Abstract

The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a new contact design approach.
Proceedings Title
2020 Conference on Precision Electromagnetic Measurements(CPEM 2020)
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO, US
Pub Type
Conferences

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Keywords

electrical measurement standards, ac quantized Hall resistance, epitaxial graphene
Electrical / electromagnetic metrology

Citation

Kruskopf, M. , Patel, D. , Liu, C. , Rigosi, A. , Elmquist, R. , Wang, Y. , Bauer, S. , Yin, Y. , Pierz, K. , Pesel, E. , Goetz, M. and Schurr, J. (2020), Graphene quantum Hall effect devices for AC and DC resistance metrology, 2020 Conference on Precision Electromagnetic Measurements(CPEM 2020), Denver, CO, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929635 (Accessed April 28, 2024)

Created August 27, 2020, Updated October 12, 2021