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Metrology

Electrical / electromagnetic metrology

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Displaying 51 - 75 of 458

Physical Models and Dimensional Traceability of 2.4 mm Coaxial Airline Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

July 6, 2023
Author(s)
Jeffrey Jargon, Dylan Williams, Angela Stelson, Chris Long, Aaron Hagerstrom, John R. Stoup, Eric S. Stanfield
In this report, we document the models and dimensional traceability of our 2.4 mm coaxial airline standards for performing multiline thru-reflect-line calibrations up to 50 GHz using vector network analyzers. We identify the equations used in our models of

Microwave Characterization of Parylene C Dielectric and Barrier Properties

June 29, 2023
Author(s)
Nikolas Dale Barrera, Jacob Pawlik, Eugene Yoon, James Booth, Christian Long, Nathan Orloff, Ellis Meng, Angela Stelson
Parylene C thin films are commonly used as a passivation layer, protective coating, or substrate material in implantable medical devices. However, fluid or vapor may permeate through Parylene C films over time through defects, film edges, or bulk diffusion

Preparing for 6G: Developing best practices and standards for industrial measurements of low-loss dielectrics

May 23, 2023
Author(s)
Lucas Enright, Marzena Olszewska-Placha, Michael Hill, Say Phommakesone, Daisuke Kato, Charles Hill, Hanna Kahari, Chiawen Lee, Chang-Sheng Chen, Nate Orloff, Malgorzata Celuch, Urmi Ray
With growing interest in millimeter-wave (mmWave, 30 GHz – 300 GHz) technologies, researchers and manufacturers need standard reference materials and best practices for measurement validation, material acceptance, and quality assurance. Today, there is no

Rydberg Atoms for One-Step Traceability for Sensing Electric Fields

May 8, 2023
Author(s)
Aly Artusio-Glimpse, Christopher L. Holloway, Matt Simons, Nik Prajapati, Drew Rotunno, Samuel Berweger, Kaleb Campbell, Maitreyi Jayaseelan
Absolute electric field measurements present a "chicken-and-egg" situation where calibration of field probes relies on accurate knowledge of the field while precise determination of the field involves measurements with a calibrated probe. Metrology

A field-effect transistor-based room-temperature quantum current source

May 4, 2023
Author(s)
Kin (Charles) Cheung, Barry J O'Sullivan
The work provides a proof-of-concept demonstration of the room-temperature quantum current source based on nanoscale metal-oxide-semiconductor-Field-Effect-Transistor (MOSFET). Using low leakage MOSFET, the current pump achieved 1.00011 ± 0.00022 charges

On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

January 11, 2023
Author(s)
Elyse McEntee Wei, Richard Chamberlin, Nate Kilmer, Joshua Kast, Jake A. Connors, Dylan Williams
We describe a system for performing on-wafer vector-network-analyzer measurements from 100 MHz to 15 GHz at mK temperatures (i.e., less than 20 mK). We first demonstrate a camera-less probe positioning system and calibrate this system at 4.4 K. We then use

A Macroscopic Mass From Quantum Behavior In An Integrated Approach

December 10, 2022
Author(s)
Frank Seifert, Alireza Panna, Lorenz Keck, Leon Chao, Shamith Payagala, Dean G. Jarrett, Dipanjan Saha, Randolph Elmquist, Stephan Schlamminger, Albert Rigosi, David B. Newell, Darine El Haddad
The revision of the International System of Units (SI) on May 20th, 2019, has enabled new improved experiments to consolidate and simplify electrical and mechanical metrology currently underway. Historically within the SI, the definition of energy was only

Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

September 30, 2022
Author(s)
Papa Amoah, Joseph J. Kopanski, Yaw S. Obeng, Christopher Sunday, Chukwudi Okoro, Lin You, Dmirty Veksler
In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. We introduce a suite of non-destructive metrologies that can serve as early

Modern RF Measurements with Hot Atoms

April 4, 2022
Author(s)
Aly Artusio-Glimpse, MATTHEW SIMONS, Nik Prajapati, chris holloway
Over a hundred years later, the classic antenna, first invented by Heinrich Hertz, in 1888, [1], is still the dominant technology used for the measurement of RF fields. Just seven years after its invention, Guglielmo Marconi applied the antenna to long

The irony of the magnet system for Kibble balances -- a review

March 1, 2022
Author(s)
Stephan Schlamminger, Shisong Lo
The magnet system is an essential component in the Kibble balance, supplying the magnetic flux that plays a vital role as the geometric factor $Bl$. Ironically, the $Bl$ factor cancels out and does not appear in the final Kibble equation. Nevertheless

Predicting solar cell performance from terahertz and microwave spectroscopy

February 26, 2022
Author(s)
Hannes Hempel, Edwin J. Heilweil, Timothy Magnanelli
Mobilities and lifetimes of photogenerated charge carriers are core properties of photovoltaic materials and can both be characterized by contactless terahertz or microwave measurements. Previously reported values for lead-halide perovskites vary by orders

Units for Magnetic Quantities

September 28, 2021
Author(s)
Ronald B. Goldfarb
The centimeter-gram-second (CGS) system of units was adopted by the pioneers of electromagnetism in the nineteenth century. By the early twentieth century, two limitations of the CGS system became apparent: its inability to gracefully incorporate the

Cryogenic single-port calibration for superconducting microwave resonator measurements

June 28, 2021
Author(s)
Haozhi Wang, Suren Singh, Corey Rae McRae, Joseph C. Bardin, S.-X. Lin, A. R. Castelli, Y. J. Rosen, David P. Pappas, J. Y. Mutus
Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or
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