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Graphene Quantum Electrical Metrology for National Measurement Standards

Published

Author(s)

Randolph Elmquist, Swapnil Mhatre, Alireza Panna, Albert Rigosi, Dinesh Patel, Mattias Kruskopf
Proceedings Title
The 20th International Symposium on the Physics of Semiconductors and Applications
Conference Dates
July 17-23, 2022
Conference Location
Jeju, KR
Conference Title
International Symposium on the Physics of Semiconductors and Applications 2022

Citation

Elmquist, R. , Mhatre, S. , Panna, A. , Rigosi, A. , Patel, D. and Kruskopf, M. (2022), Graphene Quantum Electrical Metrology for National Measurement Standards, The 20th International Symposium on the Physics of Semiconductors and Applications , Jeju, KR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934144 (Accessed April 12, 2024)
Created May 13, 2022, Updated November 29, 2022