Elmquist, R.
, Mhatre, S.
, Panna, A.
, Rigosi, A.
, Patel, D.
and Kruskopf, M.
(2022),
Graphene Quantum Electrical Metrology for National Measurement Standards, The 20th International Symposium on the Physics of Semiconductors and Applications , Jeju, KR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934144
(Accessed April 19, 2024)
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Graphene Quantum Electrical Metrology for National Measurement Standards
Published
Author(s)
, , , , Dinesh Patel, Mattias Kruskopf
Proceedings Title
The 20th International Symposium on the Physics of Semiconductors and Applications
Conference Dates
July 17-23, 2022
Conference Location
Jeju, KR
Conference Title
International Symposium on the Physics of Semiconductors and Applications 2022
Pub Type
Conferences
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Citation
Created May 13, 2022, Updated November 29, 2022