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PUBLICATIONS

Quantitative characterization of epitaxial graphene for the application of quantum Hall resistance standard

Published

Author(s)

Linli Meng, Alireza Panna, Swapnil Mhatre, Albert Rigosi, Shamith Payagala, Dipanjan Saha, Ngoc Thanh Mai Tran, Ching-Chen Yeh, Randolph Elmquist, Angela R. Hight Walker, Dean G. Jarrett, David B. Newell, Yanfei Yang
Proceedings Title
IEEE Proceedings for the Conference on Precision Electromagnetic Measurements 2022
Conference Dates
December 5-9, 2022
Conference Location
Wellington, NZ
Pub Type
Conferences

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Local Download
Metrology and Electrical / electromagnetic metrology

Citation

Meng, L. , Panna, A. , Mhatre, S. , Rigosi, A. , Payagala, S. , Saha, D. , Tran, N. , Yeh, C. , Elmquist, R. , Hight Walker, A. , Jarrett, D. , Newell, D. and Yang, Y. (2022), Quantitative characterization of epitaxial graphene for the application of quantum Hall resistance standard, IEEE Proceedings for the Conference on Precision Electromagnetic Measurements 2022 , Wellington, NZ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935073 (Accessed March 13, 2025)

Issues

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Created December 12, 2022, Updated November 29, 2022