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Cryogenic single-port calibration for superconducting microwave resonator measurements



Haozhi Wang, Suren Singh, Corey Rae McRae, Joseph C. Bardin, S.-X. Lin, A. R. Castelli, Y. J. Rosen, David P. Pappas, J. Y. Mutus


Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.
Quantum Science and Technology


one-port cryogenic calibration, data-based calibration, superconducting resonator, reflection measurement


Wang, H. , Singh, S. , McRae, C. , Bardin, J. , Lin, S. , Castelli, A. , Rosen, Y. , Pappas, D. and Mutus, J. (2021), Cryogenic single-port calibration for superconducting microwave resonator measurements, Quantum Science and Technology, [online], (Accessed June 13, 2024)


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Created June 28, 2021, Updated April 25, 2023