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Manufacturing

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Displaying 2151 - 2175 of 2183

Strategy for Post-Process Control of a Machine Tool

January 1, 1994
Author(s)
Theodore V. Vorburger, K Yee, Brian R. Scace, F Rudder
The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and post-process. This paper highlights the post-process loop. The architecture is being

The Design of an Atomic Force Microscope for Metrology

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National

The Development of a Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of Atomic

The Geometric Characterization of Rockwell Diamond Indenters

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement

The International Standard of Length

January 1, 1994
Author(s)
Dennis A. Swyt
This chapter discusses the modern concept of traceability as it applies to CMM measurements of manufactured parts. It shows the means by which those dimensional measurements are functionally related to the international standard of length, the various

Traceable Standards for Scanning Electron Microscopy

January 1, 1994
Author(s)
Michael T. Postek
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and

Uncertainties in Dimensional Measurements Made at Nonstandard Temperatures

January 1, 1994
Author(s)
Dennis A. Swyt
This report examines the effects of uncertainties in temperature and coefficient of thermal expansion on the expanded uncertainty of length dimensional measurements made away from the international standard reference temperature of 20degrees C for artifact

Variations in Size Measurements by Indicating Gaging Systems

January 1, 1994
Author(s)
Ralph C. Veale, A Strang, S Merrit, H Chou
The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing four

ADACS - An Automated System for Part Finishing

April 1, 1993
Author(s)
Keith A. Stouffer, John L. Michaloski, B Russell, Frederick M. Proctor
This paper describes an automated finishing system called the Advanced Deburring and Chamfering System (ADACS). ADACS uses the Real-Time Control System (RCS), a hierarchical controller architecture that was developed at the National Institute of Standards

Regimes of Surface Roughness Measurable with Light Scattering

January 1, 1993
Author(s)
Theodore V. Vorburger, Egon Marx, T Lettieri
In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establish

The Mathematics of Datums

January 1, 1990
Author(s)
Ted Hopp
Datums have been one of the most difficult problems the Group has dealt with. With the definition outlined, we feel we now have the problem under control. While our definition is not perfect, we can live with it. We are now in the process of expanding this
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