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Mary Kombolias, Jan Obrzut, Michael T. Postek, Dianne L. Poster, Yaw S. Obeng
The current analytical techniques for characterizing printing and graphic arts substrates are largely ex situ and destructive. This limits the amount of data that can be obtained from an individual sample and renders it difficult to produce statistically
Jeffrey T. Fong, N. Alan Heckert, James Filliben, Pedro V. Marcal, Samuel Berweger, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric finite element analysis (FEA) code to guide the microscope user on how to optimize the settings
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, David R. Novotny
Recently, we introduced a Rydberg-atom based mixer capable of detecting and measuring of the phase of a radio-frequency field through the electromagnetically induced transparency (EIT) and Autler-Townes (AT) effect. The ability to measure phase with this
Aric Sanders, John Bass, Arpita Bhutani, Mary A. Ho, Jim Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than humans. The process of quality management in radio-frequency measurements is an arduous one that
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Carl J. Williams
We dominate how Rydberg atoms and the phenomena of electromagnetically induced transparency can be used to record a musical instrument in real time as it is played. We discuss how this ``entertaining'' example of an application of quantum physics is timely
Any eSPM measurement of a spatially varying electric field at the surface of a sample has a large uncertainty due to the unknown details of the tip shape near the surface. We have designed an electric field gradient reference sample to provide an
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon
Rydberg atoms have been shown to be very useful in performing absolute measurements of the magnitude of a radio frequency (RF) field using electromagnetically-induced transparency (EIT). However, there has been less success in using Rydberg atoms for the
In recent work we derived the generalized sheet transition conditions (GSTCs) for electromagnetic fields at the surface of a metascreen (a metasurface with a ``fishnet'' structure, i.e., an periodic array of arbitrary spaced apertures in an relatively
Duane J. McCrory, Mark Anders, Jason Ryan, Pragya Shrestha, Kin P. Cheung, Patrick M. Lenahan, Jason Campbell
We report on a novel electron paramagnetic resonance (EPR) technique that merges electrically detected magnetic resonance (EDMR) with a conventional semiconductor wafer probing station. This union, which we refer to as wafer-level EDMR (WL-EDMR), allows
Charles A. Little, Angela C. Stelson, Nathan D. Orloff, Christian J. Long, James C. Booth
Broadband microwave microfluidics is an emerging technique for quantifying the frequency dependent electrical response of fluids in the microwave regime. This technique can access important physical properties including interfacial polarization, ion
Camillo A. Gentile, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley, Peter G. Vouras, Jelena Senic, Jian Wang, Jack Chuang, Ruoyu Sun
The exponential increase in wireless data transmission from smartphones has led to the saturation of the sub-6-GHz bands, forcing cellular providers to migrate to the millimeter-wave (mmWave) regime for 5G. Although available channel bandwidths will grow
Nina P. Basta, Jasper A. Drisko, Aaron M. Hagerstrom, Joshua A. Orlicki, Jennifer M. Sietins, Daniel B. Knorr, Jr., Edward J. Garboczi, Christian J. Long, Nathan D. Orloff
The electrical properties of materials are a necessary part of any circuit design. As applications at millimeter-wave frequen-cies increase, there is a growing need to develop new materials with low loss and multiple functionalities. Unfortunately, many
Joshua A. Gordon, David R. Novotny, Michael S. Allman
We present on an all-optical spatial metrology system, the PiCMM, that aids in the alignment and tracking of antennas with accuracies on the order of 25 microns and 0.01 deg. This system speeds up millimeter-wave antenna alignment, does not require contact
The centimeter-gram-second system of electromagnetic units (EMU) has been used in magnetism since the late 19th century. The International System of Units (SI), a successor to Giorgi's 1901 meter- kilogram-second system, was adopted by the General
The National Institute of Standards and Technology has been using commercial robotic arms to characterize antenna gain and radiation patterns. The transition from custom antenna hardware to commercial robotics has opened up new capabilities but has also
Christopher L. Holloway, Matthew T. Simons, David R. Novotny, John H. Lehman, Paul A. Williams, Gordon A. Shaw
We discuss a power measurement technique traceable to the International System of Units based on radiation pressure (or radiation force) carried by an electromagnetic wave. A measurement of radiation pressure offers the possibility for a power measurement
Matthew T. Simons, Marcus D. Kautz, Joshua A. Gordon, Christopher L. Holloway
A new atom-based electric (E) field measurement approach (using Rydberg atoms) is being investigated by several groups around the world as a means to develop a new SI-traceable RF E- field standard. For this technique to be useful it is important to
Nicholas G. Paulter Jr., Donald R. Larson, John A. Ely
Measuring the detection performance of metal detectors (hand-worn, hand-held, and walk-through models) is based on the observation of an alarm indication (light, sound, vibration) given by the metal detector when a threat or test object is present. These
Ivan Ryger, Aly Artusio-Glimpse, Paul A. Williams, Gordon A. Shaw, Matt Simons, Christopher L. Holloway, John H. Lehman
We demonstrate a compact electromagnetic power sensor based on force effects of electromagnetic radiation onto a highly reflective mirror surface. Unlike the conventional power measurement approach, the photons are not absorbed and can be further used in
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Edward Garboczi, Christian Long, Nathan Orloff
— Electrical properties of materials are a necessary part of any circuit design. With emerging applications at millimeter- wave frequencies, there is a need to characterize new materials before they come to market. At frequencies below about 67 GHz, it is
Christopher L. Holloway, Alexandra B. Artusio-Glimpse, Ivan Ryger, John H. Lehman
In the quest for a new SI traceable power measurement, we performed measurements of the radiation pressure of a radio-frequency (RF) electromagnetic field. There are several groups around the world investigating methods to perform more direct SI traceable
We are developing a fundamentally new atom-based approach for electric (E) field measurements. This new approach will lead to a self-calibrated, SI traceable, E-field measurement, and has the capability to perform measurements on a fine spatial resolution
Christopher L. Holloway, Matt Simons, Dave Anderson, Georg Raithel
—Measurements of radio-frequency (RF) electric fields using atomic sensors based on quantum-optical spectroscopy of Rydberg states in vapors has garnered significant interest in recent years for the establishment of atomic standards for RF electric fields
High emissivity temperature-controlled microwave blackbodies, or calibration targets, are often used as brightness temperature reference sources for radiometer calibration. Calibration targets are, in practice, often viewed from a range of angles due to