Determining Carbon Fiber Composite Loading with Flip-Chip Measurements to 110 GHz
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Edward Garboczi, Christian Long, Nathan Orloff
— Electrical properties of materials are a necessary part of any circuit design. With emerging applications at millimeter- wave frequencies, there is a need to characterize new materials before they come to market. At frequencies below about 67 GHz, it is common to perform both on- wafer calibrations and on-wafer materials characterization with multiple transmission lines fabricated on a material under test. In contrast, at frequencies above 67 GHz, it is common to employ a multiple-offset-reflect calibration technique. Here, we explore the possibility of employing multiple-offset-reflect devices for on-wafer materials characterization at frequencies up to 110 GHz. To compare our results, we performed companion analyses with multiline thru- reflect-line, extracting the permittivity of fused silica and SU-8, a common photo-curable polymer. For fused silica, we obtained a permittivity of 𝟑. 𝟖𝟎 ± 𝟎. 𝟎𝟏 across the full frequency regime. For SU-8, we obtained a permittivity of 𝟑. 𝟑𝟎 ± 𝟎. 𝟎𝟏 at 28 GHz, which agreed with the literature.
IEEE Transactions on Microwave Theory and Techniques
, Hagerstrom, A.
, Drisko, J.
, Booth, J.
, Garboczi, E.
, Long, C.
and Orloff, N.
Determining Carbon Fiber Composite Loading with Flip-Chip Measurements to 110 GHz, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926775
(Accessed April 22, 2021)