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Development and Applications of a Fiber-Coupled Atom-Based Electric Field Probe

Published

Author(s)

Christopher L. Holloway, Matt Simons, Josh Gordon

Abstract

We are developing a fundamentally new atom-based approach for electric (E) field measurements. This new approach will lead to a self-calibrated, SI traceable, E-field measurement, and has the capability to perform measurements on a fine spatial resolution in both the far- and near- fields. Here, we discuss the development and applications of the first moveable fiber-coupled version of this atom-based E-field measurement approach. We show results for various measurements including: far-field measurements of the E-fields, measurements of the E-field distribution along the surface of a circuit board, field measurements in apertures, measurements of the directivity pattern of a horn antenna, and measurements made in a GTEM cell.
Proceedings Title
International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018
Conference Dates
August 27-31, 2018
Conference Location
Amsterdam, NL

Keywords

Rydberg atoms, atom-based metrology, electric field

Citation

Holloway, C. , Simons, M. and Gordon, J. (2018), Development and Applications of a Fiber-Coupled Atom-Based Electric Field Probe, International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018, Amsterdam, NL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925570 (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 26, 2018, Updated April 13, 2022