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Uncertainties in Rydberg Atom-based RF E-field Measurements

Published

Author(s)

Matthew T. Simons, Marcus D. Kautz, Joshua A. Gordon, Christopher L. Holloway

Abstract

A new atom-based electric (E) field measurement approach (using Rydberg atoms) is being investigated by several groups around the world as a means to develop a new SI-traceable RF E- field standard. For this technique to be useful it is important to understand the uncertainties. In this paper, we examine and quantify the sources of uncertainty present with this Rydberg atom- based RF (E-field) measurement technique.
Proceedings Title
International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018
Conference Dates
August 27-30, 2018
Conference Location
Amsterdam

Keywords

Rydberg atoms, Electromagnetically-induced transparency, SI traceability, antenna metrology

Citation

Simons, M. , Kautz, M. , Gordon, J. and Holloway, C. (2018), Uncertainties in Rydberg Atom-based RF E-field Measurements, International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018, Amsterdam, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925898 (Accessed April 14, 2024)
Created October 8, 2018, Updated March 19, 2019