Machine Learning in a Quality Managed RF Measurement Workflow

Published

July 6, 2019

Author(s)

Aric Sanders, John Bass, Arpita Bhutani, Mary A. Ho, Jim Booth

Abstract

Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than humans. The process of quality management in radio-frequency measurements is an arduous one that requires a skilled human to interpret complex data sets and frequently leads to long diagnostic routines when a measurement fails a quality check, or an operator makes a mistake. We demonstrate the application of machine learning classifiers to improve a common task in a quality managed measurement workflow. Specifically, we demonstrate that a machine learning classifier can predict the device attached to a measurement apparatus and additionally predict if one of the connections has been improperly torqued, furthermore predicting which connection is loosened.

Proceedings Title

93rd ARFTG Microwave Measurement Conference

Conference Dates

July 7, 2019

Conference Location

Boston, MA, US

Pub Type

Conferences

Download Paper

Local Download

Keywords

Artificial intelligence, machine learning, quality management, rf metrology, verification standards

Citation

Sanders, A. , Bass, J. , Bhutani, A. , Ho, M. and Booth, J. (2019), Machine Learning in a Quality Managed RF Measurement Workflow, 93rd ARFTG Microwave Measurement Conference, Boston, MA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927522 (Accessed October 5, 2024)