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Electronics

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Displaying 526 - 550 of 695

Scanning Height for ANSI C63.5 Calibrations

August 1, 1998
Author(s)
Kenneth H. Cavcey, Dennis G. Camell
The configuration of antennas at an Open Area Test site (OATS) for calibrations results in constructive and destructive electric fields. Regardless of the calibration method used, the antenna to be calibrated should be loacted where the field varies slowly

International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz

July 1, 1998
Author(s)
James P. Randa, J. Achkar, F. I. Buchholz, T. Colard, D. Schubert, M. Sinclair, John Rice, G. S. Williams
We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All results

Characterization of On-Wafer Diode Noise Sources

June 1, 1998
Author(s)
James P. Randa, Dave K. Walker, Lawrence P. Dunleavy, Robert L. Billinger, John Rice
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer

Uncertainties in NIST Noise-Temperature Measurements

March 1, 1998
Author(s)
James P. Randa
Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 to 12

Characterization of Coplanar Waveguide on Epitaxial Layers

August 14, 1997
Author(s)
Dylan F. Williams, J. M. Belquin, Alain Spisser, Alain Cappy, G. Dambrine
We examine the effect of thin AlInAs/GaInAs epitaxial layers on the propagation of electrical signals in coplanar waveguide transmission lines fabricated on semi-insulating indium phosphide substrates. We show that argon isolation implants effectively

Noise-Temperature Measurement System for the WR-28 Band

August 1, 1997
Author(s)
James P. Randa, L. A. Terrell
The NIST Noise Project has constructed and tested a radiometer for the measurement of noise sources in the WR-28 waveguide band (26.5 GHz to 40 GHz). It is a total-power radiometer which incorporates a six-port reflectometer for the measurement of relevant

Embedded multiconductor transmission line characterization

June 8, 1997
Author(s)
Dylan F. Williams
This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with significant electrical parasitics. We test the method on a pair of lossy coupled asymmetric

Electrothermal Simulation of an IGBT PWM Inverter

May 1, 1997
Author(s)
Alan Mantooth, Allen R. Hefner Jr.
A recently developed electrothermal network simulation methodoogy is used to analyze the behavior of a full-bridge, pulse-width modulated (PWM), voltage-source inverter, which uses insulated gate bipolar transistors (IGBT's) as the switching devices. The

Multiconductor Transmission Line Characterization

May 1, 1997
Author(s)
Dylan F. Williams
This paper presents a measurement method that completely characterizes lossy printed multiconductor transmission lines. It determines not only the matrices of impedances and admittances per unit length describing the transmission line in the conductor
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