Dunleavy, L.
, Randa, J.
, Walker, D.
, Billinger, R.
and Rice, J.
(1998),
Characterization and Applications of On-Wafer Diode Noise Sources, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5598
(Accessed September 20, 2024)
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Characterization and Applications of On-Wafer Diode Noise Sources
Published
Author(s)
Lawrence P. Dunleavy, , , , John Rice
Abstract
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
46
Issue
12
Pub Type
Journals
Download Paper
Keywords
noise, noise measurement, on-wafer noise, noise characterization, noise temperature
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 30, 1998, Updated October 12, 2021