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PUBLICATIONS

Characterization and Applications of On-Wafer Diode Noise Sources

Published

Author(s)

Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice

Abstract

A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
46
Issue
12
Pub Type
Journals

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Local Download

Keywords

noise, noise measurement, on-wafer noise, noise characterization, noise temperature
Semiconductors, Electronics, Electromagnetics and Advanced communications

Citation

Dunleavy, L. , Randa, J. , Walker, D. , Billinger, R. and Rice, J. (1998), Characterization and Applications of On-Wafer Diode Noise Sources, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5598 (Accessed April 19, 2024)

Created November 30, 1998, Updated October 12, 2021