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Characterization and Applications of On-Wafer Diode Noise Sources

Published

Author(s)

Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice

Abstract

A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
46
Issue
12

Keywords

noise, noise measurement, on-wafer noise, noise characterization, noise temperature

Citation

Dunleavy, L. , Randa, J. , Walker, D. , Billinger, R. and Rice, J. (1998), Characterization and Applications of On-Wafer Diode Noise Sources, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5598 (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 30, 1998, Updated October 12, 2021