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Talks

Smart Grid Standards and Power Electronics Technologies to Enable High Penetration of Renewable Energy

August 31, 2010

Author(s)

Allen R. Hefner Jr.

Global View of International Standards and Measurements: Challenges and Concerns for Nanotechnologies

August 30, 2010

Author(s)

Herbert S. Bennett

We first discuss why international standards are important for nanomanufacturing and business models. The scopes and structures of the International...

Nanopore-based Single Molecule Determination of Polymer-cation Binding and Membrane Protein Dynamics

August 24, 2010

Author(s)

Joseph E. Reiner, John J. Kasianowicz, Joseph W. Robertson

Nanopore-based Single Molecule Determination of Polymer-cation Binding and Membrane Protein Dynamics

August 24, 2010

Author(s)

Joseph E. Reiner, John J. Kasianowicz, Joseph W. Robertson

Polyethylene glycol (PEG) is a ubiquitous charge-neutral polymer having several useful properties. It has been used to estimate the diameter of functioning...

From Chemical Abstracts to SciFinder: Transitioning to SciFinder and Assessing Customer Usage

August 22, 2010

Author(s)

Susan L. Makar, Stacy M. Bruss

The Research Library of the National Institute of Standards and Technology (NIST) monitors SciFinder usage to ensure customers have ready access to the database...

Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology

August 3, 2010

Author(s)

Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn

This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope...

MEMS Standards Development at the National Institute of Standards and Technology

July 22, 2010

Author(s)

Richard A. Allen

A Round Robin Experiment to Compare Methods to Measure Voids in Bonded Wafer Pairs

July 14, 2010

Author(s)

Richard A. Allen

Status of the MEMS Standardization Project at NIST: July 2010

July 12, 2010

Author(s)

Janet M. Cassard

Why Contacts Matter

July 7, 2010

Author(s)

David J. Gundlach, Y. Li, D. A. Zhou, D A. Mourey, Thomas Jackson

Switching in Flexible Titanium Oxide Memristors

June 25, 2010

Author(s)

Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter

In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with...

The U.S.--Poland Energy Roundtable Smart Grid Applications

June 23, 2010

Author(s)

Allen R. Hefner Jr.

Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

June 23, 2010

Author(s)

LC Teague, Oana Jurchescu, Curt A. Richter, Sankar Subramanian, John E. Anthony, Thomas Jackson, David J. Gundlach, James G. Kushmerick

Quantum Dot FRET Sensor for Enzymatic Activity in Microfluidic Device

June 22, 2010

Author(s)

Georgeta Crivat, Sandra M. Da Silva, Darwin Reyes-Hernandez, Samuel Forry, Laurie E. Locascio, Michael Gaitan, Nitsa Rosenzweig, Zeev Rosenzweig

This paper describes the development of new fluorescence resonance energy transfer (FRET)-based quantum dot probes for proteolytic activity. The CdSe/ZnS...

Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities

June 21, 2010

Author(s)

Qin Zhang, Y Lu, Huili Xing, Curt A. Richter, Steven J. Koester, S O. Koswatta

New Methods for the Direct Extraction of Mobility and Series Resistance from a Single Ultra-Scaled Device

June 15, 2010

Author(s)

Jason P. Campbell, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, Kuang Sheng, A Oates

The engineering of channel mobility (μ) and series resistance (RSD) in advanced CMOS technologies are both extremely challenging and of paramount importance...

Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"

June 7, 2010

Author(s)

Samuel M. Stavis, Jon C. Geist, Michael Gaitan

Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device

June 4, 2010

Author(s)

Mariona Coll Bau, Nadine E. Gergel-Hackett, Oana Jurchescu, Curt A. Richter, Christina A. Hacker

Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry

May 28, 2010

Author(s)

Nhan V. Nguyen, Oleg A. Kirillov, John S. Suehle

USA s 3Rs (Recycling, Reuse, Reduce) Activity

May 27, 2010

Author(s)

John V. Messina

Electronic Counterfeiting

May 27, 2010

Author(s)

John V. Messina

Cloud Computing and Supply Chain Management

May 27, 2010

Author(s)

John V. Messina

Ultrasensitive Detection of Biowarfare Agents with Single Molecule Mass Spectrometry

May 27, 2010

Author(s)

Joseph W. Robertson, John J. Kasianowicz, Joseph E. Reiner

Energy Storage -- Distributed Energy Resource (ES-DER), Standards Goals and Scoping Document Status

May 25, 2010

Author(s)

Allen R. Hefner Jr.

Microfluidic Directed Assembly of Liposome-hydrogel Hybrid Nanoparticles

May 25, 2010

Author(s)

Jennifer S. Hong, Samuel M. Stavis, Laurie E. Locascio, Silvia H. De Paoli Lacerda, Srinivasa R. Raghavan, Michael Gaitan

Metrology to Support Innovation in Nanoelectronics

May 20, 2010

Author(s)

Curt A. Richter

Coordination and Acceleration of Smart Grid Interoperability Standards

May 20, 2010

Author(s)

Allen R. Hefner Jr.

Coordination and Acceleration of Smart Grid Interoperability Standards

May 11, 2010

Author(s)

Allen R. Hefner Jr.

Coordination and Acceleration of Smart Grid Interoperability Standards

May 6, 2010

Author(s)

Allen R. Hefner Jr.

Gate Dielectrics Year-In-Review

May 3, 2010

Author(s)

Jason P. Campbell

The gate dielectrics year-in-review includes a comprehensive examination of the past year s reports which detail gate stack reliability issues and the...

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