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Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

Published

Author(s)

LC Teague, Oana Jurchescu, Curt A. Richter, Sankar Subramanian, John E. Anthony, Thomas Jackson, David J. Gundlach, James G. Kushmerick

Citation

Teague, L. , Jurchescu, O. , Richter, C. , Subramanian, S. , Anthony, J. , Jackson, T. , Gundlach, D. and Kushmerick, J. (2010), Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy (Accessed September 27, 2021)
Created June 23, 2010, Updated February 19, 2017