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Talks

Airless Solar System Bodies: Improvements to Radiative Transfer Modeling of Reflectance Spectra

November 2, 2010

Author(s)

Nhan V. Nguyen

Smart Grid Standards, Codes and Interoperability Framework

October 27, 2010

Author(s)

Allen R. Hefner Jr.

Assessing Library Performance Using the Baldrige Criteria for Performance Excellence: Framework and Systems that Focus on Results and Ensure Sustainability

October 25, 2010

Author(s)

Susan L. Makar, Mary D. Coraggio, Mylene S. Ouimette, Barbara P. Silcox

Successful management of organizational performance requires interconnected systems that link goals and strategies with customer and stakeholder requirements

Assessing Library Performance Using the Baldrige Criteria for Performance Excellence: Role Model Practices

October 25, 2010

Author(s)

Mary D. Coraggio, Barbara P. Silcox, Susan L. Makar, Mylene S. Ouimette

Best practices for assessment suggest that data routinely gathered from a variety of sources and viewed holistically should provide meaningful evidence for

Thermo-Magneto-Electrical Measurement Platform

October 19, 2010

Author(s)

Kurt Pernstich, Curt A. Richter, David J. Gundlach

Intercomparison of Methods for Detecting and Characterizing Voids in Bonded Wafer Pairs

October 14, 2010

Author(s)

Richard A. Allen

The Wafer Bond Task Force of the SEMI MEMS Standards Committee has begun a round robin experiment to evaluate methods for identifying and characterizing voids

Nanoparticle Formation and Characterization in Continuous Flow Microfluidic Systems

October 13, 2010

Author(s)

Samuel M. Stavis, Michael Gaitan

Smart Grid Integration of Renewables, Storage, and Plug-in Vehicles

October 6, 2010

Author(s)

Allen R. Hefner Jr.

Defect depth profiling in gate dielectrics

September 29, 2010

Author(s)

Kin P. Cheung

Defects in gate dielectric greatly impact the performance and reliability of advanced MOSFETs. The introduction of high-k/metal gate technology makes the

An IEEE 1588 Time Synchronization Testbed for Assessing Power Distribution Requirements

September 29, 2010

Author(s)

Julien M. Amelot, Jeffrey Fletcher, Dhananjay Anand, Clement Vasseur, YaShian Li-Baboud, James Moyne

Seeking Science and Technology

September 28, 2010

Author(s)

Stacy M. Bruss, Keith R. Martin

Although not everyone can be a sci-tech information specialist, science, technology, and medicine (STM) tends to overlap with other research agendas. This

Electrical Measurement-Based Mass Spectrometry for Detection of Pathogenic Bacteria

September 27, 2010

Author(s)

John J. Kasianowicz, Joseph W. Robertson, Vitalii I. Silin, Joseph E. Reiner

Electrical Measurement-Based Mass Spectrometry for Detection of Pathogenic Bacteria

September 27, 2010

Author(s)

John J. Kasianowicz, Joseph W. Robertson, Vitalii I. Silin, Joseph E. Reiner

Protein Nanopores: Their Roles in Biology and Biotechnology

September 24, 2010

Author(s)

Ariel Michelman-Ribeiro

Medical Applications of Nano-electrotechnologies: Challenges and Concerns for Technology Roadmaps, International Standards and Measurements

September 23, 2010

Author(s)

Herbert S. Bennett

This paper presents reasons why standards are important for medical applications of nano-electrotechnologies and summarizes ongoing consensus-based

Protein Nanopores: Their Roles in Biology and Biotechnology

September 22, 2010

Author(s)

Ariel Michelman-Ribeiro

Graphene Nanoribbon Tunnel FETs

September 21, 2010

Author(s)

Qin Zhang

The Forms and Functions of Complex Nanofluidic Surfaces

September 14, 2010

Author(s)

Samuel M. Stavis, Elizabeth A. Strychalski, Jon C. Geist, Laurie E. Locascio, Michael Gaitan

Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion

September 13, 2010

Author(s)

Samuel M. Stavis, Jon C. Geist, Michael Gaitan

Model-Based Standards Development: A case study in Material Declaration

September 1, 2010

Author(s)

John V. Messina, Eric D. Simmon

Microfluidic Based Contactless DielectrophoreticDevice: Modeling and Analysis

September 1, 2010

Author(s)

Saugandhika Minnikanti, Darwin Reyes-Hernandez, Ruben C. Aguilar, Joseph Pancrazio, Michael Gaitan, Nathalia Peixoto

While there have been many attempts at patterning cells onto substrates, a reliable method for trapping cell clusters and forming cell arrays in a predefined

Smart Grid Standards and Power Electronics Technologies to Enable High Penetration of Renewable Energy

August 31, 2010

Author(s)

Allen R. Hefner Jr.

Global View of International Standards and Measurements: Challenges and Concerns for Nanotechnologies

August 30, 2010

Author(s)

Herbert S. Bennett

We first discuss why international standards are important for nanomanufacturing and business models. The scopes and structures of the International

Nanopore-based Single Molecule Determination of Polymer-cation Binding and Membrane Protein Dynamics

August 24, 2010

Author(s)

Joseph E. Reiner, John J. Kasianowicz, Joseph W. Robertson

Nanopore-based Single Molecule Determination of Polymer-cation Binding and Membrane Protein Dynamics

August 24, 2010

Author(s)

Joseph E. Reiner, John J. Kasianowicz, Joseph W. Robertson

Polyethylene glycol (PEG) is a ubiquitous charge-neutral polymer having several useful properties. It has been used to estimate the diameter of functioning

From Chemical Abstracts to SciFinder: Transitioning to SciFinder and Assessing Customer Usage

August 22, 2010

Author(s)

Susan L. Makar, Stacy M. Bruss

The Research Library of the National Institute of Standards and Technology (NIST) monitors SciFinder usage to ensure customers have ready access to the database

Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology

August 3, 2010

Author(s)

Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn

This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope

MEMS Standards Development at the National Institute of Standards and Technology

July 22, 2010

Author(s)

Richard A. Allen

A Round Robin Experiment to Compare Methods to Measure Voids in Bonded Wafer Pairs

July 14, 2010

Author(s)

Richard A. Allen

Status of the MEMS Standardization Project at NIST: July 2010

July 12, 2010

Author(s)

Janet M. Cassard