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Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry

Published

Author(s)

Nhan V. Nguyen, Oleg A. Kirillov, John S. Suehle

Citation

Nguyen, N. , Kirillov, O. and Suehle, J. (2010), Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry (Accessed April 13, 2024)
Created May 28, 2010, Updated February 19, 2017