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Journals

The Interface Development for Machine Shop Simulation

Author(s)
Yan Luo, Yung-Tsun T. Lee
Modeling and simulation technology is recognized for facilitating training, reducing production cost, improving product quality, and shortening development time...

Integral Operators and Delay Differential Equations

Author(s)
David E. Gilsinn, Florian A. Potra
We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in...

Advanced Metrology Needs for Nanoelectronics Lithography

Author(s)
Stephen Knight, Ronald Dixon, Ronald L. Jones, Eric Lin, Ndubuisi G. Orji, Richard M. Silver, Andras Vladar, Wen-li Wu
The semiconductor industry has exploited productivity improvements through aggressive feature size reduction for over four decades. While enormous effort has...

A Brighter Future From Gallium Nitride Nanowires

Author(s)
Kristine A. Bertness, Norman Sanford, Albert Davydov
How might nitride semiconductor nanowires change the future of computing? In the spirit of this special issue on how science fiction might become working...

Impulse Spectrum Amplitude Uncertainty Analysis

Author(s)
Nicholas Paulter, Donald R. Larson
A detailed uncertainty analysis for an impulse spectrum amplitude measurement system is presented. This analysis includes consideration of effects such as...

Eliminating FFT Artifacts in Vector Signal Analyzer Spectra

Author(s)
Michael McKinley, Kate Remley, M. Myslinski, J. S. Kenney
We present a method to minimize spectral leakage in measurements of periodic signals made with the vector signal analyzer (VSA) by taking into account the...

Microcantilever Torque Magnetometry Study of Patterned Magnetic Films

Author(s)
L. Yuan, Lan Gao, R. Sabirianov, Sy-hwang Liou, Michelle Chabot, Dong-Hoon Min, John M. Moreland, Bao Shan Han
Microcantilever torque magnetometry (MTM) is a sensitive tool to measure small magnetization changes in the sample. In this paper, we investigated a process for...

Phase Velocity in Resonant Structures

Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Derik Love, Thomas Mitchell (Mitch) Wallis, Christopher L. Holloway, Pavel Kabos
In this paper we present a simple experimental procedure for studying the phase velocity behavior of a metafilm with tunable material properties. Using this...

Eval-Ware: Digital Video Retrieval

Author(s)
Paul D. Over, Alan Smeaton
The short write up highlights some Internet resources of interest connection with evaluation of digital video retrieval systems.
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