U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Journals

On-chip, photon-number-resolving, telecommunication-band detectors for scalable photonic information processing

Author(s)
Thomas Gerrits, Nick Thomas-Peter, James Gates, Adriana E. Lita, Benjamin Metcalf, Brice R. Calkins, Nathan A. Tomlin, Anna E. Fox, Antia A. Lamas-Linares, Justin Spring, Nathan Langford, Richard P. Mirin, Peter Smith, Ian Walmsley, Sae Woo Nam
Integration is currently the only feasible route towards scalable photonic quantum processing devices which are sufficiently complex to be genuinely useful in...

Common Origin of the Two Types of Magnetic Fluctuations in Iron Chalcogenides

Author(s)
Songxue Chi, Jose Rodriguez Rivera, Jeffrey W. Lynn, Chenglin Zhang, D. Phelan, Deepak Singh, Rick L. Paul, Pengcheng Dai
We use inelastic neutron scattering to study the low energy spin excitations in moderately doped non-superconducting Fe 1.01Te 0.72Se 0.28. The spin excitations...

MOSFETs made from GaN nanowires with fully conformal cylindrical gates

Author(s)
Paul T. Blanchard, Kristine A. Bertness, Todd E. Harvey, Aric W. Sanders, Norman A. Sanford, Steven M. George, Dragos Seghete
We report novel metal-oxide-semiconductor field effect transistors (MOSFETs) based on individual gallium nitride (GaN) nanowires with fully conformal...

Ductile-Fracture Resistance in X100 Pipeline Welds Measured with CTOA

Author(s)
Elizabeth S. Drexler, Philippe P. Darcis, Christopher N. McCowan, Jeffrey W. Sowards, Joseph D. McColskey, Thomas A. Siewert
A test for evaluation of resistance to ductile fracture (crack tip opening angle, CTOA) was found to reveal changes in crack propagation through the strain and...

Nanofibers for RF and Beyond

Author(s)
Thomas M. Wallis, Kichul Kim, Pavel Kabos, Dejan Filipovic
In order to realize new interconnect concepts based on nanofibers, reliable metrology is required. Given the clock-speeds of integrated circuits in the present...

Letter to the Editor of the CTBUH Journal

Author(s)
Sivaraj Shyam-Sunder, Jason D. Averill, Fahim Sadek
NIST was invited to comment on the articles written for a special issue of the CTBUH Journal, marking the ten years passed since the 2001 9/11 attacks on the...

Computing Network Reliability Coefficients

Author(s)
Elizabeth R. Moseman, Isabel M. Beichl, Francis Sullivan
When a network is modeled by a graph and edges of the graph remain reliable with a given probability p, the probability of the graph remaining connected is...

A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"

Author(s)
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nate Orloff, James Booth, Juan M. O'C allaghan
"This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the...

Development and Certification of Green Tea-Containing Standard Reference Materials

Author(s)
Lane Sander, Mary Bedner, Michael C. Tims, James Yen, David Duewer, Barbara J. Porter, Steven Christopher, Russell D. Day, Stephen E. Long, John Molloy, Karen Murphy, Brian Lang, Rachel A. Lieberman, Laura J. Wood, M. Payne, M. C. Roman, J. M. Betz, A. NguyenPho, Katherine Sharpless, Stephen Wise
A suite of three green tea-containing Standard Reference Materials (SRMs) has been issued by the National Institute of Standards and Technology (NIST). The...
Was this page helpful?