Achieving 0.2 % Relative Expanded Uncertainty in Ion Chromatography Analysis using a High-Performance Methodology

Published

April 12, 2011

Author(s)

Ryan G. Brennan, Therese A. Butler, Michael R. Winchester

Abstract

A high-performance (HP) technique that was originally developed for inductively coupled plasma optical emission spectrometry (ICP-OES) has been successfully translated to ion chromatography (IC) to enable analyses with extremely low uncertainty. As an example application of the HP-IC methodology, analyses of several National Institute of Standards and Technology (NIST) Standard Reference Materials (SRMs) in the SRM 3180 series of anion standard solutions are reported. The relative expanded uncertainty values expressed at 95 % confidence for these analyses range from 0.087 % to 0.27 % and average 0.18 %. Strong correlation between analyte and internal standard anion peak heights or peak areas, as well as the use of a unique drift-correction approach, is shown to be important for attaining such low uncertainty.

Citation

Analytical Chemistry

Volume

83

Pub Type

Journals

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Keywords

high-performance (HP), ion chromatography (IC), low uncertainty, anion SRM

Citation

Brennan, R. , Butler, T. and Winchester, M. (2011), Achieving 0.2 % Relative Expanded Uncertainty in Ion Chromatography Analysis using a High-Performance Methodology, Analytical Chemistry, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906747 (Accessed October 9, 2025)