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Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range

Published

Author(s)

Lawrence T. Hudson, C M. O'Brien, Uri Feldman, Stephen M. Seltzer, Hye-Sook Park, John F. Seely

Abstract

Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow bandwidth x-ray source fluences in the 20 keV to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x-ray emission levels from laser-produced plasmas and other laboratory sources.
Citation
Optics Letters
Volume
36

Keywords

diffraction, x-ray spectroscopy, x-ray

Citation

Hudson, L. , O'Brien, C. , Feldman, U. , Seltzer, S. , Park, H. and Seely, J. (2011), Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range, Optics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907535 (Accessed April 20, 2024)
Created April 15, 2011, Updated February 19, 2017