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Diode Power Probe Measurements of Wireless Signals

Published

Author(s)

Catherine A. Remley, Hugo Gomes, Alejandro Testera, Nuno B. Carvalho, Monica Barciela

Abstract

A new view of diode power probes is presented is this paper. It is shown analytically, by simulations and with measurements, that calibration procedures for diode power probes should be rethought when measuring new wireless standard type of signals. In this respect, an improved analysis of long term-memory effects and the behavior of power probes when in the presence of wideband and high peak-to-average-power ratio (PAPR) signals is analyzed and studied. It is shown that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis will first be theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements using a diode power probe. A similar approach is used for high PAPR signals when using multisines as the excitation signal.
Citation
IEEE Transactions on Microwave Theory and Techniques

Keywords

Diode Power Probe, Long-term Memory Effects, Nonlinear Devices, Power Measurement, PAPR, Wireless Systems

Citation

Remley, C. , Gomes, H. , Testera, A. , Carvalho, N. and Barciela, M. (2011), Diode Power Probe Measurements of Wireless Signals, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906083 (Accessed June 19, 2024)

Issues

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Created April 15, 2011, Updated February 19, 2017