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Conferences

Building a Quality System Based on ANSI/NCSL Z540-1-1994 -- An Effort by the Radiometric Physics Division at NIST,

January 1, 1995

Author(s)

S S. Bruce, Thomas C. Larason

A Simple and Repeatable Technique for Measuring the Critical Current of Nb₃Sn Superconducting WireS

January 1, 1995

Author(s)

Loren F. Goodrich, A N. Srivastava

Data Management for Error Compensation and Process Control

January 1, 1995

Author(s)

Herbert T. Bandy, David E. Gilsinn

Strategies for managing data flow are described for a system which controls processes to compensate machine tool and process errors. A CAD representation of the...

Calibration Uncertainties for Microform of Rockwell Hardness Indenters

January 1, 1995

Author(s)

F Rudder, Jun-Feng Song

A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform...

A Metrology Approach to Unifying Rockwell C Hardness Scales

January 1, 1995

Author(s)

Jun-Feng Song, J Smith, Theodore V. Vorburger

Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of...

Influence of Thickness Fluctuations on Exchange Coupling in Fe/Cr/Fe Structures

January 1, 1995

Author(s)

Joseph A. Stroscio, Daniel T. Pierce, John Unguris, Robert Celotta

Measurement and Analysis of Forces in Grinding of Silicon Nitride

January 1, 1995

Author(s)

S Jahanmir, T W. Hwang, Eric P. Whitenton, S Job, Christopher J. Evans

Using an instrumented surface grinder, the two components of grinding forces (normal and tangential) were measured for different types of silicon nitride...

Measurement of Patterned Film Linewidth for Interconnect Characterization

January 1, 1995

Author(s)

L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A. Kramar

The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have...

Using Atom Optics to Fabricate Nanostructures

January 1, 1995

Author(s)

Robert Celotta, Jabez J. McClelland, R E. Scholten, R Gupta

STM Studies of GMR Spin Valves

January 1, 1995

Author(s)

R Misra, T Ha, Y Kadmon, Cedric J. Powell, Mark D. Stiles, Robert McMichael

We have investigated the surface roughness and the grain size in giant magnetoresistance (GMR) spin valve multilayers of the general type: FeMn/Ni 80Fe 20/Co/Cu...

Coherence Effects, Lasing-without-Inversion and Raman Self-Oscillations in Rb

January 1, 1995

Author(s)

A S. Zibrov, Leo W. Hollberg, M D. Lukin, D E. Nikonov

Population- and Coherence-Induced Gain and Self-Oscillations in Alkali Vapor

January 1, 1995

Author(s)

A S. Zibrov, Hugh Robinson, V L. Velichansky, V V. Vasiliev, Leo W. Hollberg, E Arimondo, M D. Lukin, M O. Scully

Tunable Far-Infrared Absorption Spectroscopy of CH₂F₂, CH₃OH and ¹³CD₃OH Laser Transitions, ed. by M. Inguscio, M. Allegrini, and A. Sasso

January 1, 1995

Author(s)

E C. Vasconcellos, S C. Zerbetto, F Stroh, K M. Evenson

A New 100 MHz Low Noise Distribution Amplifier

January 1, 1995

Author(s)

Marco Siccardi, S Romisch, F L. Walls, A Demarchi

Nonlinear Optics for Optical Frequency Synthesis and an Optical Divide by 3

January 1, 1995

Author(s)

M M{umlat}rtz, O Pfister, J. H. Marquardt, M Stephens, J. S. Wells, Hollberg L. Waltman, Hugh Robinson, Richard W. Fox, D Mehuys, E R. Brown, K A. Mcintosh