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L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A. Kramar
The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have
R Misra, T Ha, Y Kadmon, Cedric J. Powell, Mark D. Stiles, Robert McMichael
We have investigated the surface roughness and the grain size in giant magnetoresistance (GMR) spin valve multilayers of the general type: FeMn/Ni 80Fe 20/Co/Cu
M M{umlat}rtz, O Pfister, J. H. Marquardt, M Stephens, J. S. Wells, Hollberg L. Waltman, Hugh Robinson, Richard W. Fox, D Mehuys, E R. Brown, K A. Mcintosh
Athough AI planning techniques can potentially be useful in several manufacturing domains, this potential remains largely unrealized. Many of the issues
The National Institute of Standards and Technology (NIST) has build numerous software toolkits and applications for manipulating STEP and EXPRESS data. These
Although AI planning techniques can potentially be uaefuI in severaI manufacturing domains, this potential remains largely unrealized. In order to adapt AI