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Conferences

Experiment and Simulation of Field-Emitter Arrays with Planar Lens Focusing

January 1, 1995

Author(s)

C -. Tang, T A. Swyden, L N. Yadon, D Temple, C A. Ball, W D. Palmer, J E. Mancusi, D Vellenga, G E. Mcguire

Photoassociation in Ultracold Collisions: High Resolution Spectroscopy from the Collision Continuum, ed. by L. Dube

January 1, 1995

Author(s)

Paul D. Lett

Photoassociative Ionization Spectroscopy of Ultracold Na, ed. by H.-J. Kluge, J.E. Parks, and K. Wendt

January 1, 1995

Author(s)

Paul D. Lett, L P. Ratliff, M E. Wagshul, William D. Phillips, S L. Rolston

Challenges to Opto-Mechanical Design from X-Ray Interferometry and Gamma-Ray Diffraction

January 1, 1995

Author(s)

R Deslattes, Ernest G. Kessler

Study of Laser Resonance Ionization Mass Spectrometry Using a Glow Discharge Source,

January 1, 1995

Author(s)

X Xiong, J M. Hutchinson, J D. Fassett, Thomas B. Lucatorto, Francis J. Schima, William J. Bowman, K R. Hess

Scattering by a Dielectric Wedge: Oblique Incidence

January 1, 1995

Author(s)

Egon Marx

The scattering of a plane monochromatic wave by an infinite dielectric wedge is discussed for arbitrary direction of incidence and polarization. Two sets of

SPM-Based Lithography for Electronics Device Fabrication: New Strategies and Directions

January 1, 1995

Author(s)

John A. Dagata

Direct patterning of a semiconductor surface to produce an ultrathin oxide mask has proven to be a promising approach for integrating lithographic methods based

EXPRESS: The International Standard Versus the Draft Standard

January 1, 1995

Author(s)

Peter Wilson

This paper describes, with examples, the changes made to the EXPRESS information modeling language between its balloting as an ISO Draft International Standard

Anomalous relation between time and frequency domain PMD measurements

January 1, 1995

Author(s)

Paul A. Williams, P. R. Hernday

We report nearly simultaneous measurements of polarization mode dispersion (PMD) in various samples of highly mode-coupled single-mode fiber using the

Automated Measurements of Nonlinearity of Optical Fiber Power Meters

January 1, 1995

Author(s)

Igor Vayshenker, Shao Yang, Xiaoyu X. Li, Thomas Scott

Building a Quality System Based on ANSI/NCSL Z540-1-1994 -- An Effort by the Radiometric Physics Division at NIST,

January 1, 1995

Author(s)

S S. Bruce, Thomas C. Larason

A Simple and Repeatable Technique for Measuring the Critical Current of Nb₃Sn Superconducting WireS

January 1, 1995

Author(s)

Loren F. Goodrich, A N. Srivastava

Data Management for Error Compensation and Process Control

January 1, 1995

Author(s)

Herbert T. Bandy, David E. Gilsinn

Strategies for managing data flow are described for a system which controls processes to compensate machine tool and process errors. A CAD representation of the

Calibration Uncertainties for Microform of Rockwell Hardness Indenters

January 1, 1995

Author(s)

F Rudder, Jun-Feng Song

A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform

A Metrology Approach to Unifying Rockwell C Hardness Scales

January 1, 1995

Author(s)

Jun-Feng Song, J Smith, Theodore V. Vorburger

Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of

Influence of Thickness Fluctuations on Exchange Coupling in Fe/Cr/Fe Structures

January 1, 1995

Author(s)

Joseph A. Stroscio, Daniel T. Pierce, John Unguris, Robert Celotta

Measurement and Analysis of Forces in Grinding of Silicon Nitride

January 1, 1995

Author(s)

S Jahanmir, T W. Hwang, Eric P. Whitenton, S Job, Christopher J. Evans

Using an instrumented surface grinder, the two components of grinding forces (normal and tangential) were measured for different types of silicon nitride

Measurement of Patterned Film Linewidth for Interconnect Characterization

January 1, 1995

Author(s)

L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A. Kramar

The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have

Using Atom Optics to Fabricate Nanostructures

January 1, 1995

Author(s)

Robert Celotta, Jabez J. McClelland, R E. Scholten, R Gupta

STM Studies of GMR Spin Valves

January 1, 1995

Author(s)

R Misra, T Ha, Y Kadmon, Cedric J. Powell, Mark D. Stiles, Robert McMichael

We have investigated the surface roughness and the grain size in giant magnetoresistance (GMR) spin valve multilayers of the general type: FeMn/Ni 80Fe 20/Co/Cu

Coherence Effects, Lasing-without-Inversion and Raman Self-Oscillations in Rb

January 1, 1995

Author(s)

A S. Zibrov, Leo W. Hollberg, M D. Lukin, D E. Nikonov

Population- and Coherence-Induced Gain and Self-Oscillations in Alkali Vapor

January 1, 1995

Author(s)

A S. Zibrov, Hugh Robinson, V L. Velichansky, V V. Vasiliev, Leo W. Hollberg, E Arimondo, M D. Lukin, M O. Scully

Tunable Far-Infrared Absorption Spectroscopy of CH₂F₂, CH₃OH and ¹³CD₃OH Laser Transitions, ed. by M. Inguscio, M. Allegrini, and A. Sasso

January 1, 1995

Author(s)

E C. Vasconcellos, S C. Zerbetto, F Stroh, K M. Evenson

A New 100 MHz Low Noise Distribution Amplifier

January 1, 1995

Author(s)

Marco Siccardi, S Romisch, F L. Walls, A Demarchi

Nonlinear Optics for Optical Frequency Synthesis and an Optical Divide by 3

January 1, 1995

Author(s)

M M{umlat}rtz, O Pfister, J. H. Marquardt, M Stephens, J. S. Wells, Hollberg L. Waltman, Hugh Robinson, Richard W. Fox, D Mehuys, E R. Brown, K A. Mcintosh