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Conferences

Appearance Potentials of Ions Produced by Electron-Impact Induced Dissociative Ionization of SF₆ and Related Compounds

March 1, 1995

Author(s)

Ken L. Stricklett, J. M. Kassoff, James K. Olthoff, Richard J. Van Brunt

Methods are described, which are based on the use of a commercial mass spectrometer, for determination of ionization and fragment ion appearance potentials by...

Modification of Cast Epoxy Resin Surfaces during Exposure to Partial Discharges

March 1, 1995

Author(s)

H. Slowikowska, T. Las, J. Slowikowski, Richard J. Van Brunt

Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer

March 1, 1995

Author(s)

Richard J. Van Brunt, James K. Olthoff, Ken L. Stricklett, D Wheeler

Knowledge Based Reactive Scheduling using Integration of Neural Nets, Simulation, Genetic Algorithms and Machine Learning

March 1, 1995

Author(s)

Luis C. Rabelo, Albert T. Jones

This paper addresses the development and implementation of real-time reactive scheduling and control decision-making in hierarchical manufacturing environments...

A Visually Intensive Lifecycle Framework for Robotic Applications

February 17, 1995

Author(s)

Nicholas Tarnoff, Albert J. Wavering, Ronald Lumia

Robotics & Intelligent Systems, Metrology

Public Domain Optical Character Recognition

February 8, 1995

Author(s)

Michael D. Garris, J L. Blue, Gerald T. Candela, Darrin L. Dimmick, Jon C. Geist, Patrick J. Grother, Stanley Janet, Charles L. Wilson

Computer Modeling of Heterodyne Interferometer Errors

January 1, 1995

Author(s)

Lowell P. Howard, Jack A. Stone Jr.

A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and...

Testing the sensitivity of accelerometers using mechanical shock pulses under NIST Special Publication 250 Special Test No. 24040S

January 1, 1995

Author(s)

David J. Evans

Physics and Chemistry of Partial Discharge and Corona - Recent Advances and Future Challenges

January 1, 1995

Author(s)

Richard J. Van Brunt

Transient Analysis of a Line-focus Transducer Probing a Liquid/Solid Interface

January 1, 1995

Author(s)

Nelson N. Hsu, Gerald V. Blessing, Steven E. Fick, D Xiang

The use of a line-focus transducer operating in pulse-echo mode to probe a liquid/solid interface is a new technique which has many engineering applications. To...

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing...