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Conferences

An Open Architecture Based Framework for Automation and Intelligent System Control

May 1, 1995

Author(s)

Hui-Min Huang, John L. Michaloski, Nicholas Tarnoff, M Nashman

Re-Evaluation of the Accuracy of NIST Photomask Linewidth Standards

May 1, 1995

Author(s)

James E. Potzick

Every artifact measurement standard has some uncertainty associated with its calibration, and the NIST Photomask Linewidth Standards are no exception. This...

Display-Measurement Round-Robin

May 1, 1995

Author(s)

D. J. Bechis, M. D. Grote, D. P. Bortfeld, L. H. Hammer, M. J. Polak, Edward F. Kelley, George R. Jones Jr., Paul A. Boynton

The effects of Spindle Dynamic Characteristics on Hard Turning

May 1, 1995

Author(s)

Kari K. Harper, Yoichi Matsumoto, Alkan Donmez, Matthew A. Davies

A Survey of the Components of Display Measurement Standards

May 1, 1995

Author(s)

Edward F. Kelley, George R. Jones Jr., Paul A. Boynton, M. D. Grote, D. J. Bechis

Modeling the Product Realization Process: Requirements, Methods and Research Issues for Computer Support Tools

May 1, 1995

Author(s)

Kevin W. Lyons, M R. Duffey

This paper presents a bottom up introduction to process modeling requirements for product realization which should drive new methods and computer tools. Though...

Metrology with the Ultraviolet Scanning Transmission Microscope

May 1, 1995

Author(s)

Richard M. Silver, James E. Potzick, Y Hu

A novel design for an ultraviolet critical dimension measurement transmission microscope utilizing the Stewart platform as the rigid main structure has been...

Progress on Accurate Metrology of Pitch, Height, Roughness, and Width Artifacts Using an Atomic Force Microscope

May 1, 1995

Author(s)

J Schneir, T Mcwaid, Ronald G. Dixson, V W. Tsai, John S. Villarrubia, Edwin R. Williams, E Fu

NIST personnel visited 23 IC manufacturing companies and equipment suppliers during 1994 to determine semiconductor industry needs for scanned probe metrology...

Overlay Measurements and Standards

May 1, 1995

Author(s)

Richard M. Silver, James E. Potzick, Robert D. Larrabee

The relative misalignment of features produced by different mask levels (i.e., overlay error) is projected to become an increasingly important problem to the...

Single-Port Technique for Adaptor Efficiency Evaluation

May 1, 1995

Author(s)

S. P. Pucic, W C. Daywitt

Applicability of Modern Analytical Techniques to Detection of Changes in Roofing Membrane Materials Brought About By Heat Aging.

April 26, 1995

Author(s)

Walter J. Rossiter Jr, Walter E. Byrd, Willard E. Roberts, Dawn M. Bailey

The U.S. Army Construction Engineering Research (CERL) has been investigating the development of a test methodology for evaluating the service life of roofing...

Combustion Product Formation in Under and Overventilated Full-Scale Enclosure Fires

April 23, 1995

Author(s)

William M. Pitts, Nelson P. Bryner, Erik L. Johnsson

The findings of an extensive series of over 140 natural gas fires in a 2/5ths-scale model of a standard room have been previously reported. The current work...

Tomographic Reconstruction of the Local PDFS of Soot Volume Fraction and Temperature

April 23, 1995

Author(s)

Y. R. Sivathanu, Anthony Hamins, Robert Hagwood, Takashi Kashiwagi

Deconvolution of local properties from line-of-sight measurements is important in a wide variety of applications such as x-ray tomography, nuclear magnetic...

Distributed Feedback Lasers in Rare-Earth-Doped Phosphate Glass

April 6, 1995

Author(s)

D. L. Veasey, K. J. Malone, J. A. Aust, Norman Sanford, Alexana Roshko

Application of Neural Networks for Discriminating Fire Detectors.

April 4, 1995

Author(s)

J A. Milke

Research is being conducted to describe the characteristics of an improved fire detector which promptly reacts to smoke while discriminating between smoke and...

A 100 Ampere, 100 kHz Transconductance Amplifier

April 1, 1995

Author(s)

Owen B. Laug

Effects of Nonmodel Errors on Model-Based Testing

April 1, 1995

Author(s)

Gerard N. Stenbakken

Quantum Hall Effect-Based Resistance Standard: Capabilities and Implementation

April 1, 1995

Author(s)

Kevin C. Lee

A 100 Ampere, 100 kHz Transconductance Amplifier

April 1, 1995

Author(s)

Owen B. Laug

Methods for Aligning the NIST Watt-Balance

April 1, 1995

Author(s)

Gerard N. Stenbakken, Richard L. Steiner, P. T. Olsen, Edwin R. Williams

A Decision-based Framework for Exploring Assembly Configuration

April 1, 1995

Author(s)

Gerard Kim

In most engineering design processes, there are three major phases of design: functional, conceptual, and detailed design (Gui94). However, most current...

Deep-UV excimer laser measurements at NIST

April 1, 1995

Author(s)

Rodney W. Leonhardt, Thomas Scott

Dielectric Measurements on Printed-Wiring and Circuit Boards, Thin Films, and Substrates: An Overview

April 1, 1995

Author(s)

James R. Baker-Jarvis, Chriss A. Jones

Bounds on Frequency Response Estimates Derived From Uncertain Step Response Data

April 1, 1995

Author(s)

J. P. Deyst, T. M. Souders

Influence of Surface Charge on the Stochastic Behavior of Partial Discharges in Dielectrics

April 1, 1995

Author(s)

Richard J. Van Brunt, P. G. Von Glahn, T. Las

Evaluation of Software for Coordinate Measuring Systems

April 1, 1995

Author(s)

Cathleen Diaz, Ted Hopp

Coordinate measuring systems (CMSs) determine dimensional (length) characteristics of mechanical parts by analyzing 3-dimensional point data acquired on part...

Evaluation of Sprinkler Activation Prediction Methods

March 15, 1995

Author(s)

Daniel M. Madrzykowski

The objective of this study was to evaluate the ability of sprinkler activation models to predict activation time. Large scale compartment fire tests were used...

The NIST Real-time Control System (RCS) An Applications Survey

March 1, 1995

Author(s)

James S. Albus

The Real-time Control System (RCS) architecture developed at NIST and elsewhere over the past two decades [1] defines a canonical form for a nested intelligent...

Decomposition of SF6 and Production of S2F10 in Power Arcs

March 1, 1995

Author(s)

H. D. Morrison, F. Y. Chu, M. Eygenraam, I. Sauers, Richard J. Van Brunt

Decomposition of Sulfur Hexafluoride by X-rays

March 1, 1995

Author(s)

James K. Olthoff, Richard J. Van Brunt

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