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Conferences

Challenges to Opto-Mechanical Design from X-Ray Interferometry and Gamma-Ray Diffraction

January 1, 1995

Author(s)

R Deslattes, Ernest G. Kessler

Computer Modeling of Heterodyne Interferometer Errors

January 1, 1995

Author(s)

Lowell P. Howard, Jack A. Stone Jr.

A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and

Minimizing Time Dilation in Penning Trap Ion Clocks,

January 1, 1995

Author(s)

Joseph N. Tan, John J. Bollinger, David J. Wineland

Intercomparison of Temperature Scales with a Transfer Standard Radiation Thermometer Among Five National Institutes

January 1, 1995

Author(s)

Bettye C. Johnson, Charles E. Gibson, Graham Machin, T Ricolfi, M Battuello, J Fischer, H J. Jung

Study of Laser Resonance Ionization Mass Spectrometry Using a Glow Discharge Source,

January 1, 1995

Author(s)

X Xiong, J M. Hutchinson, J D. Fassett, Thomas B. Lucatorto, Francis J. Schima, William J. Bowman, K R. Hess

Testing the sensitivity of accelerometers using mechanical shock pulses under NIST Special Publication 250 Special Test No. 24040S

January 1, 1995

Author(s)

David J. Evans

The Evaluation of NIST-7: A New Era

January 1, 1995

Author(s)

Jon H. Shirley, W D. Lee, Robert E. Drullinger

Study of Laser Resonance Ionization Mass Spectrometry Using a Glow Discharge Source

January 1, 1995

Author(s)

X Xiong, J M. Hutchinson, J D. Fassett, Thomas B. Lucatorto, Francis J. Schima, William J. Bowman, K R. Hess

Scattering by a Dielectric Wedge: Oblique Incidence

January 1, 1995

Author(s)

Egon Marx

The scattering of a plane monochromatic wave by an infinite dielectric wedge is discussed for arbitrary direction of incidence and polarization. Two sets of

Physics and Chemistry of Partial Discharge and Corona - Recent Advances and Future Challenges

January 1, 1995

Author(s)

Richard J. Van Brunt

Recent Improvements Made to the NIST Frequency Measurement Service,

January 1, 1995

Author(s)

Michael A. Lombardi, L M. Nelson

Search for Time-Reversal Non-Invariance in Neutron Beta Decay

January 1, 1995

Author(s)

E G. Wasserman, Jeffrey S. Nico

SPM-Based Lithography for Electronics Device Fabrication: New Strategies and Directions

January 1, 1995

Author(s)

John A. Dagata

Direct patterning of a semiconductor surface to produce an ultrathin oxide mask has proven to be a promising approach for integrating lithographic methods based

Transient Analysis of a Line-focus Transducer Probing a Liquid/Solid Interface

January 1, 1995

Author(s)

Nelson N. Hsu, Gerald V. Blessing, Steven E. Fick, D Xiang

The use of a line-focus transducer operating in pulse-echo mode to probe a liquid/solid interface is a new technique which has many engineering applications. To

Authentication, Time-Stamping and Digital Signatures,"

January 1, 1995

Author(s)

Judah Levine

A Comprehensive Set of Conversion Coefficients for Photons

January 1, 1995

Author(s)

Christopher G. Soares, P R. Martin

EXPRESS: The International Standard Versus the Draft Standard

January 1, 1995

Author(s)

Peter Wilson

This paper describes, with examples, the changes made to the EXPRESS information modeling language between its balloting as an ISO Draft International Standard

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing

UTC Dissemination to the Real-Time User

January 1, 1995

Author(s)

Judah Levine

The ¹⁰B(n,α₁γ)⁷Li Cross Section Between 10 keV to 1 MeV

January 1, 1995

Author(s)

R A. Schrack, O A. Wasson, D C. Larson, J K. Dickens, J H. Todd

Anomalous relation between time and frequency domain PMD measurements

January 1, 1995

Author(s)

Paul A. Williams, P. R. Hernday

We report nearly simultaneous measurements of polarization mode dispersion (PMD) in various samples of highly mode-coupled single-mode fiber using the