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Conferences

SPM-Based Lithography for Electronics Device Fabrication: New Strategies and Directions

January 1, 1995

Author(s)

John A. Dagata

Direct patterning of a semiconductor surface to produce an ultrathin oxide mask has proven to be a promising approach for integrating lithographic methods based

Transient Analysis of a Line-focus Transducer Probing a Liquid/Solid Interface

January 1, 1995

Author(s)

Nelson N. Hsu, Gerald V. Blessing, Steven E. Fick, D Xiang

The use of a line-focus transducer operating in pulse-echo mode to probe a liquid/solid interface is a new technique which has many engineering applications. To

Authentication, Time-Stamping and Digital Signatures,"

January 1, 1995

Author(s)

Judah Levine

A Comprehensive Set of Conversion Coefficients for Photons

January 1, 1995

Author(s)

Christopher G. Soares, P R. Martin

EXPRESS: The International Standard Versus the Draft Standard

January 1, 1995

Author(s)

Peter Wilson

This paper describes, with examples, the changes made to the EXPRESS information modeling language between its balloting as an ISO Draft International Standard

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing

UTC Dissemination to the Real-Time User

January 1, 1995

Author(s)

Judah Levine

The ¹⁰B(n,α₁γ)⁷Li Cross Section Between 10 keV to 1 MeV

January 1, 1995

Author(s)

R A. Schrack, O A. Wasson, D C. Larson, J K. Dickens, J H. Todd

Anomalous relation between time and frequency domain PMD measurements

January 1, 1995

Author(s)

Paul A. Williams, P. R. Hernday

We report nearly simultaneous measurements of polarization mode dispersion (PMD) in various samples of highly mode-coupled single-mode fiber using the

Hubble observations of D/H in the local ISM and consequences for cosmology, ed. by P. Crane

January 1, 1995

Author(s)

J L. Linsky, A Diplas, T R. Ayres, B E. Wood, A Brown

High-Magnetic-Field Corrections to Cesium Hyperfine Structure,

January 1, 1995

Author(s)

Wayne M. Itano

Dosimetry: Systems and Standards

January 1, 1995

Author(s)

M C. Saylor, W L. Mclaughlin

The JILA Penning trap mass spectrometer

January 1, 1995

Author(s)

Thomas P. Heavner, M Zuo, P Hayes, G H. Dunn, Steven R. Jefferts

An Extension of the Allan Variance which Removes a Bias at Long Term

January 1, 1995

Author(s)

David A. Howe

Real-Time Monitoring of Electron Processors

January 1, 1995

Author(s)

S V. Nablo, D R. Kneeland, W L. Mclaughlin

Closed orbits and recurrences in atomic spectra: Patterns of trajectories in integrable systems, ed. by I. Alvarez, C. Cisneros and T.J. Morgan

January 1, 1995

Author(s)

J J. Gao, J B. Delos

Circular Representation of Infinitely Extended Sequences

January 1, 1995

Author(s)

David A. Howe

The Calibration of High-Dose Dosimeters in High-Energy Electron Beams

January 1, 1995

Author(s)

W L. Mclaughlin

Complex formation in electron-ion and ion-atom/molecule collisions, ed. by I. Alvarez, C. Cisneros, and T.J. Morgan

January 1, 1995

Author(s)

G H. Dunn

Simulation Study Using a New Type of Sample Variance,

January 1, 1995

Author(s)

David A. Howe, K J. Lainson

Oscillometric and Conductometric Analysis of Aqueous and Organic Dosimeter Solutions,

January 1, 1995

Author(s)

A Kov{aacute}cs, I Slezs{aacute}k, W L. Mclaughlin, A Miller

Compound state effects in ion-neutral and ion-electron interactions, ed. by D. Veza

January 1, 1995

Author(s)

G H. Dunn

Diode Lasers for Frequency Standards and Precision Spectroscopy

January 1, 1995

Author(s)

Leo W. Hollberg, J Aman, S Waltman, J. H. Marquardt, M Stephens, Richard W. Fox, D A. Van baak, C S. Weimer, Hugh Robinson, A S. Zibrov, N Mackie, T P. Zibrova, L Pendrill