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The Systems Integration for Manufacturing Applications (SIMA) Production Project at the U.S. National Institute of Standards and Technology (NIST) is working on...
Brominated fire suppressants are effective and widely used. Due to their destruction of stratospheric ozone, however, the production of these chemical was...
Despite intensive research efforts over a number of years, an understanding of scalar mixing in turbulent flows remains elusive. An understanding is required...
The ultimate purpose of the photomask in IC manufacture is to define the image to be printed on a silicon wafer. Of the many factors which affect this aerial...
This paper presents a bottom up introduction to process modeling requirements for product realization which should drive new methods and computer tools. Though...
The structure and energetics of hydrocarbons burning in a pool fire configuration are reviewed. Examples of non-hydrocarbons are also presented. The character...
C Monroe, A S. Barton, James C. Bergquist, D J. Berkeland, John Bollinger, F C. Cruz, Wayne M. Itano, Steven R. Jefferts, Branislav M. Jelenkovic, B E. King, D M. Meekhof, J D. Miller, M E. Poitzsch, Joseph N. Tan
We have recently used stimulated-Raman transitions in the resolved sideband regime to cool single ions to the n = 0 zero-point energy. This has allowed...
Traditionally, the problem of assembly planning concerns determining an order (linear or partial) of a product assembly with respect to geometric, physical, and...
A new NIST SEM magnification calibration standard has been fabricated and characterized in production prototype form. The SRM 2090A samples contain structures...
Vladimir G. Zaikin, C L. Clifton, S G. Lias, Anzor I. Mikaia, Stephen Stein, O D. Sparkman
Step-by-step procedures of spectra evaluation in the NIST/NIH/EPA mass spectral library is presented. The criteria for data inclusion to the library are...
A thermodynamic model based on the extended corresponding states principle has been developed to calculate the solubilities of nitrogen in five selected agents...
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We report accurate on-wafer measurements of transmission lines on flip-chip coplanar-waveguide MMICs. The effects are difficult to predict...
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen, Y. C. Shih
Abstract: We apply custom calibration standards and software to the accurate on-wafer measurement of MIM capacitors and spiral inductors on flip-chip coplanar...