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Conferences

Mode Coupling and Loss on Tapered Optical Waveguides

January 1, 1994

Author(s)

R. L. Gallawa, A. R. Kumar, A. Weisshar

Fundamental Limits on the Instabilities of BAW Quartz Oscillators

January 1, 1994

Author(s)

J R. Vig, F L. Walls

International Collaboration in Measurement of Differential Nuclear Data for Energy Applications in the Frame of the NEA Nuclear Science Committee

January 1, 1994

Author(s)

A Deruytter, H Weigmann, Allan D. Carlson, D Smith

Correlation of Optical, X-Ray, and Electron Microscopy Measurements on Semiconductor Multilayer Structures

January 1, 1994

Author(s)

David H. Christensen, Robert K. Hickernell, D. T. Schaafsma, Joseph G. Pellegrino, M. J. McCollum, J. R. Hill, R. S. Rai

Microwave Leakage as a Source of Systematic Error and Long-Term Instability in Cesium Atomic Beam Frequency Standards

January 1, 1994

Author(s)

W D. Lee, John P. Lowe, Jon H. Shirley, Robert E. Drullinger

Angular Variation of the Personal Dose Equivalent, H_p(0.07), for Beta Radiation and Nearly Monoenergetic Electrons: Preliminary Results

January 1, 1994

Author(s)

T A. Da silva, Christopher G. Soares

Optical Sampling Using Nondegenerate Four-Wave Mixing in a Semiconductor Laser Amplifier

January 1, 1994

Author(s)

M. Jinno, John B. Schlager, Douglas L. Franzen

Determining the Velocity Distribution of Atomic Beams by Gated Optical Pumping

January 1, 1994

Author(s)

W D. Lee, Jon H. Shirley, Robert E. Drullinger

Variable Groove Spaced Grating Monochromators for Synchrotron Light Sources,

January 1, 1994

Author(s)

M Haass, J -. Jia, T A. Callcott, D L. Ederer, K E. Miyano, R N. Watts, D R. Mueller, Charles Tarrio, E Morikawa

Measurement and Simulation of Photoluminescence Spectra from Vertical-Cavity Quantum-Well Laser Structures

January 1, 1994

Author(s)

D. T. Schaafsma, Robert K. Hickernell, David H. Christensen

A Study of the Surface Texture of Polycrystalline Phosphor Films Using AFM

January 1, 1994

Author(s)

Zsolt R?vay, J Schneir, D Brower, John S. Villarrubia, Joseph Fu, et al

Stimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the

Relationship of AM to PM Noise in Selected rf and Microwave Oscillators

January 1, 1994

Author(s)

E S. Ferre, L M. Nelson, F G. Ascarrunz, F L. Walls

Feature Recognition for Manufacturability Analysis

January 1, 1994

Author(s)

William Regli, Satyandra K. Gupta, D Nau

While automated recognition of features has been attempted for a wide range of applications, no single existing approach possesses the functionality required to

A Polarization Insensitive 3x3 Sagnac Current Sensor Using Polarizing Spun High-Birefringence Fiber

January 1, 1994

Author(s)

I. G. Clarke, Kent B. Rochford, Allen Rose, Gordon W. Day

Can Displays Deliver a Full Measure?: Manufacturing

January 1, 1994

Author(s)

Herbert S. Bennett, Charles D. Fenimore, B. F. Field, Edward F. Kelley

Tunable Phase-Locked Diode Lasers for Precision Spectroscopy

January 1, 1994

Author(s)

L D. D'evelyn, Leo W. Hollberg, Richard W. Fox, Z B. Popovic

A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards

January 1, 1994

Author(s)

John R. Stoup, Theodore D. Doiron

NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer

Efficient Vector Solution for Optical Waveguides Using Galerkin's Method with Hermite-Gauss Basic Functions

January 1, 1994

Author(s)

Andreas Weisshaar, J Li, R. L. Gallawa

Refraction of Light by Graded Birefringent Media

January 1, 1994

Author(s)

Ken L. Stricklett, C. Sununu

A CWP Phase-Lock Loop for Diode-Laser Stabilization

January 1, 1994

Author(s)

L D'evelyn, Leo W. Hollberg, Z B. Popovic

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994

Author(s)

William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague

Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the

Standard Polarization Components: Progress Toward an Optical Retardance Standard

January 1, 1994

Author(s)

Kent B. Rochford, Paul A. Williams, Allen Rose, I. G. Clarke, Paul D. Hale, Gordon W. Day

A Calibrated Atomic Force Microscope

January 1, 1994

Author(s)

T Mcwaid, J Schneir, Theodore V. Vorburger

Abstract not available.

The Variance of Predictability of Hydrogen Masers and of Primary Cesium Standards in Support of a Real Time Prediction of UTC

January 1, 1994

Author(s)

D W. Allan, Marc A. Weiss

A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer - Theoretical Aspects

January 1, 1994

Author(s)

P Sullivan, Christopher J. Evans

In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at

Effect of Semiconductor Laser Characteristics on Optical Fiber Sensor Performance

January 1, 1994

Author(s)

Kent B. Rochford, Allen Rose, I. G. Clarke, Gordon W. Day

The Design of an Atomic Force Microscope for Metrology

January 1, 1994

Author(s)

T Mcwaid, J Schneir

Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM

Search for Biomolecules in Sgr B2, ed. by S. Shostak

January 1, 1994

Author(s)

Lewis E. Snyder, Y J. Kuan, Y Miao, Francis J. Lovas

The Development of a Calibrated Atomic Force Microscope

January 1, 1994

Author(s)

T Mcwaid, J Schneir

Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in

Glasses for Waveguide Lasers

January 1, 1994

Author(s)

K. J. Malone, D. L. Veasey, Norman Sanford, J. A. Hayden