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Conferences

Influence of Surface Charge on the Stochastic Behavior of Partial Discharges in Dielectrics

April 1, 1995

Author(s)

Richard J. Van Brunt, P. G. Von Glahn, T. Las

Evaluation of Software for Coordinate Measuring Systems

April 1, 1995

Author(s)

Cathleen Diaz, Ted Hopp

Coordinate measuring systems (CMSs) determine dimensional (length) characteristics of mechanical parts by analyzing 3-dimensional point data acquired on part

Evaluation of Sprinkler Activation Prediction Methods

March 15, 1995

Author(s)

Daniel M. Madrzykowski

The objective of this study was to evaluate the ability of sprinkler activation models to predict activation time. Large scale compartment fire tests were used

The NIST Real-time Control System (RCS) An Applications Survey

March 1, 1995

Author(s)

James S. Albus

The Real-time Control System (RCS) architecture developed at NIST and elsewhere over the past two decades [1] defines a canonical form for a nested intelligent

Decomposition of SF6 and Production of S2F10 in Power Arcs

March 1, 1995

Author(s)

H. D. Morrison, F. Y. Chu, M. Eygenraam, I. Sauers, Richard J. Van Brunt

Decomposition of Sulfur Hexafluoride by X-rays

March 1, 1995

Author(s)

James K. Olthoff, Richard J. Van Brunt

Appearance Potentials of Ions Produced by Electron-Impact Induced Dissociative Ionization of SF₆ and Related Compounds

March 1, 1995

Author(s)

Ken L. Stricklett, J. M. Kassoff, James K. Olthoff, Richard J. Van Brunt

Methods are described, which are based on the use of a commercial mass spectrometer, for determination of ionization and fragment ion appearance potentials by

Modification of Cast Epoxy Resin Surfaces during Exposure to Partial Discharges

March 1, 1995

Author(s)

H. Slowikowska, T. Las, J. Slowikowski, Richard J. Van Brunt

Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer

March 1, 1995

Author(s)

Richard J. Van Brunt, James K. Olthoff, Ken L. Stricklett, D Wheeler

Knowledge Based Reactive Scheduling using Integration of Neural Nets, Simulation, Genetic Algorithms and Machine Learning

March 1, 1995

Author(s)

Luis C. Rabelo, Albert T. Jones

This paper addresses the development and implementation of real-time reactive scheduling and control decision-making in hierarchical manufacturing environments

A Visually Intensive Lifecycle Framework for Robotic Applications

February 17, 1995

Author(s)

Nicholas Tarnoff, Albert J. Wavering, Ronald Lumia

Robotics & Intelligent Systems, Metrology

Public Domain Optical Character Recognition

February 8, 1995

Author(s)

Michael D. Garris, J L. Blue, Gerald T. Candela, Darrin L. Dimmick, Jon C. Geist, Patrick J. Grother, Stanley Janet, Charles L. Wilson

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing

UTC Dissemination to the Real-Time User

January 1, 1995

Author(s)

Judah Levine

The ¹⁰B(n,α₁γ)⁷Li Cross Section Between 10 keV to 1 MeV

January 1, 1995

Author(s)

R A. Schrack, O A. Wasson, D C. Larson, J K. Dickens, J H. Todd

Anomalous relation between time and frequency domain PMD measurements

January 1, 1995

Author(s)

Paul A. Williams, P. R. Hernday

We report nearly simultaneous measurements of polarization mode dispersion (PMD) in various samples of highly mode-coupled single-mode fiber using the

Hubble observations of D/H in the local ISM and consequences for cosmology, ed. by P. Crane

January 1, 1995

Author(s)

J L. Linsky, A Diplas, T R. Ayres, B E. Wood, A Brown

High-Magnetic-Field Corrections to Cesium Hyperfine Structure,

January 1, 1995

Author(s)

Wayne M. Itano

Dosimetry: Systems and Standards

January 1, 1995

Author(s)

M C. Saylor, W L. Mclaughlin

The JILA Penning trap mass spectrometer

January 1, 1995

Author(s)

Thomas P. Heavner, M Zuo, P Hayes, G H. Dunn, Steven R. Jefferts

An Extension of the Allan Variance which Removes a Bias at Long Term

January 1, 1995

Author(s)

David A. Howe

Real-Time Monitoring of Electron Processors

January 1, 1995

Author(s)

S V. Nablo, D R. Kneeland, W L. Mclaughlin

Closed orbits and recurrences in atomic spectra: Patterns of trajectories in integrable systems, ed. by I. Alvarez, C. Cisneros and T.J. Morgan

January 1, 1995

Author(s)

J J. Gao, J B. Delos

Circular Representation of Infinitely Extended Sequences

January 1, 1995

Author(s)

David A. Howe

The Calibration of High-Dose Dosimeters in High-Energy Electron Beams

January 1, 1995

Author(s)

W L. Mclaughlin

Complex formation in electron-ion and ion-atom/molecule collisions, ed. by I. Alvarez, C. Cisneros, and T.J. Morgan

January 1, 1995

Author(s)

G H. Dunn

Simulation Study Using a New Type of Sample Variance,

January 1, 1995

Author(s)

David A. Howe, K J. Lainson

Oscillometric and Conductometric Analysis of Aqueous and Organic Dosimeter Solutions,

January 1, 1995

Author(s)

A Kov{aacute}cs, I Slezs{aacute}k, W L. Mclaughlin, A Miller

Compound state effects in ion-neutral and ion-electron interactions, ed. by D. Veza

January 1, 1995

Author(s)

G H. Dunn

Diode Lasers for Frequency Standards and Precision Spectroscopy

January 1, 1995

Author(s)

Leo W. Hollberg, J Aman, S Waltman, J. H. Marquardt, M Stephens, Richard W. Fox, D A. Van baak, C S. Weimer, Hugh Robinson, A S. Zibrov, N Mackie, T P. Zibrova, L Pendrill

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