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Conferences

Fundamental Processes in Gas Discharges

September 1, 1995

Author(s)

Loucas G. Christophorou, Richard J. Van Brunt, James K. Olthoff

Controlling the Critical Current Density of High-Temperature SNS Josephson Junctions

September 1, 1995

Author(s)

Ronald H. Ono, Leila R. Vale, Carl D. Reintsema, G. Kunkel, S. J. Berkowitz

Issues of Manufacturing Engineering Data Validation in Concurrent Engineering Environment

September 1, 1995

Author(s)

Charles R. McLean, Swee K. Leong, C Chen

Manufacturing engineering data validation is a critical engineering activity in the product realization process. This paper identifies a set of manufacturing

Rapidly Renewable Polishing Lap

September 1, 1995

Author(s)

Christopher J. Evans, R E. Parks

Textured laps can be created by slumping uniform thin films of appropriate materials over textured substrates that have been generated to the required figure

Application of the Prototype NIST SRM 2090a SEM Magnification Standard in a Manufacturing Environment

September 1, 1995

Author(s)

B Newell, Michael T. Postek, J VanDerZiel

The first NIST-traceable SEM magnification calibration standard designed to meet the particular needs of the micromanufacturing industry has been fabricated and

Comparison of UV Photosensitivity and Fluorescence During Fiber Grating Formation

September 1, 1995

Author(s)

H. Patrick, Sarah L. Gilbert

Fiber Coating Diameter: Toward a Glass Artifact Standard

September 1, 1995

Author(s)

Dylan Williams, M. Young, L. A. Tietz

Multiresolutional Intelligent Controller for Baby Robot

August 29, 1995

Author(s)

James S. Albus, Alberto Lacaze, Alex Meystel

Algorithm of Nested Clustering for Unsupervised Learning

August 29, 1995

Author(s)

James S. Albus, Alberto Lacaze, Alex Meystel

Understanding Sensitivity Analysis for Complex Fire Models

August 21, 1995

Author(s)

Walter W. Jones, Richard D. Peacock, Paul A. Reneke, Glenn P. Forney, M. M. Kostreva

Compensation of Errors Detected by Process-Intermittent Gauging

August 10, 1995

Author(s)

Herbert T. Bandy, David E. Gilsinn

This paper describes a software design for implementing compensation of errors detected by process-intermittent gauging. This is the function of one control

Computational Study of State Relationships for Acetylene-Air Diffusion Flames With Soot Radiation.

August 6, 1995

Author(s)

Z Zhang, O A. Ezekoye

Time history effects are suspected to affect the dynamics of soot evolution within heavily sooting non-premixed flames. The majority of soot chemistry

Workshop Report 3: Edge Positions From Scanning Electron Microscope Signals by Comparing Models With Measure

August 6, 1995

Author(s)

J R. Lowney, Michael T. Postek, Andras Vladar

There is a pressing need in the semiconductor industry to determine the dimensions of lithographically produced features on wafers and masks down to the l0?nm

A Standardised Computer Data File Format for Storage, Transport, and Off-line Processing of Partial Discharge Data

August 1, 1995

Author(s)

T. Huecker, P. Von, H. G. Kranz, T. Okamoto

Minimizing Throttline Losses in the Refrigeration Cycle

August 1, 1995

Author(s)

Piotr A. Domanski

Most alternative non-CFC refrigerants have a large molecular structure and large heat capacity, which influence the slope of saturated liquid line and result in

Data Evaluation of a Linear System by a Second Order Transfer Function

August 1, 1995

Author(s)

Dennis G. Camell, M T. Ma

Collaborative Design for Assembly of Complex Electro-Mechanical Products

August 1, 1995

Author(s)

Kevin W. Lyons

This presentation will describe some recent activities in collaborative design as it relates to complex electromechanical assemblies (CEMA''s). In today''s

Surging the Upside-Down House: Measurements and Modeling Results

August 1, 1995

Author(s)

Francois D. Martzloff, A. Mansoor, K. O. Phipps, W. M. Grady

Influence of Electrode Material on Measured Ion Kinetic-Energy Distributions in Radio-Frequency Discharges

August 1, 1995

Author(s)

Richard J. Van Brunt, James K. Olthoff, S. B. Radovanov

A Process Model for Production System Engineering

August 1, 1995

Author(s)

Charles R. McLean, Swee K. Leong

The Systems Integration for Manufacturing Applications (SIMA) Production Project at the U.S. National Institute of Standards and Technology (NIST) is working on

Thermal Modeling and Analysis of Laser Calorimeters

August 1, 1995

Author(s)

Nien F. Zhang, David J. Livigni, Richard D. Jones, Thomas Scott

Inhibition of Premixed Methane-Air Flames by Iron Pentacarbonyl

July 31, 1995

Author(s)

Gregory T. Linteris, G. Gmurczyk

Brominated fire suppressants are effective and widely used. Due to their destruction of stratospheric ozone, however, the production of these chemical was

Intercomparison of NRLM Copper Point and NIST Gold Point Blackbodies

July 26, 1995

Author(s)

F Sakuma, Thomas R. O'Brian, B. Carol Johnson

Rayleigh Light Scattering for Concentration Measurements in Turbulent Flows

July 25, 1995

Author(s)

William M. Pitts

Despite intensive research efforts over a number of years, an understanding of scalar mixing in turbulent flows remains elusive. An understanding is required

Metallic-barrier Junctions for Programmable Josephson Voltage Standards

July 1, 1995

Author(s)

Richard L. Kautz, Samuel P. Benz

Progress on the Quantized Hall Resistance Recommended Intrinsic/Derived Standards Practice

July 1, 1995

Author(s)

Randolph E. Elmquist

Constant Temperature and Humidity Chamber for Standard Resistors

July 1, 1995

Author(s)

Dean G. Jarrett

Improved Photomask Metrology Through Exposure Emulation

July 1, 1995

Author(s)

James E. Potzick

The ultimate purpose of the photomask in IC manufacture is to define the image to be printed on a silicon wafer. Of the many factors which affect this aerial

Automated Resistance Measurements at NIST

July 1, 1995

Author(s)

Ronald F. Dziuba

Requirements, Methods and Research Issues for Modeling the Product Realization Process

July 1, 1995

Author(s)

Kevin W. Lyons, M R. Duffey

This paper presents a bottom up introduction to process modeling requirements for product realization which should drive new methods and computer tools. Though

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