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Effects of Nonmodel Errors on Model-Based Testing

Published

Author(s)

Gerard N. Stenbakken
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Conference Dates
April 24-26, 1995
Conference Location
Waltham, MA

Citation

Stenbakken, G. (1995), Effects of Nonmodel Errors on Model-Based Testing, Proc. IEEE Instrumentation and Technology Conference (IMTC), Waltham, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=23215 (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 1995, Updated February 19, 2017