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Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer

Published

Author(s)

Richard J. Van Brunt, James K. Olthoff, Ken L. Stricklett, D Wheeler
Proceedings Title
Proc., Intl. Symp. on Gaseous Dielectrics
Conference Dates
April 24-28, 1994
Conference Location
Knoxville, TN

Citation

Van Brunt, R. , Olthoff, J. , Stricklett, K. and Wheeler, D. (1995), Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer, Proc., Intl. Symp. on Gaseous Dielectrics, Knoxville, TN, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8431 (Accessed July 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 28, 1995, Updated October 12, 2021