Van Brunt, R.
, Olthoff, J.
, Stricklett, K.
and Wheeler, D.
(1995),
Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer, Proc., Intl. Symp. on Gaseous Dielectrics, Knoxville, TN, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8431
(Accessed December 11, 2024)
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Procedure for Measuring Trace Quantities of S2F10, S2OF10, and S2O2F10 in SF6 Using a Gas Chromatograph-Mass Spectrometer
Published
Author(s)
, , , D Wheeler
Proceedings Title
Proc., Intl. Symp. on Gaseous Dielectrics
Conference Dates
April 24-28, 1994
Conference Location
Knoxville, TN
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 1995, Updated October 12, 2021