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Conferences

Status of Mass Metrology at NIST in 2000

Author(s)
Zeina J. Kubarych
This paper summarizes the activities in mass metrology at NIST. It includes a description of the facilities and the procedures used in the dissemination of the

Assessment of Machining Models: Progress Report

Author(s)
Robert W. Ivester, Michael Kennedy, Matthew A. Davies, R Stevenson, J Thiele, R Furness, S M. Athavale
Machining involves extremely localized and nonlinear physical phenomena that occur over a wide range of temperatures, pressures, and strains. This has hindered

A Novel Artifact for Testing Large Coordinate Measuring Machines

Author(s)
Steven D. Phillips, Daniel S. Sawyer, Bruce R. Borchardt, David E. Ward, D E. Beutel
We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional

The Role of Choice in Discovery

Author(s)
J E. Devaney
The discovery of functional forms can be divided into three tasks:1 - choosing a search technique to find the set of best equationswithin the limitations of

Computation of Light Scattered Into Detector

Author(s)
Egon Marx
To compare the measured bidirectional reflectance distribution function (BRDF) of a rough surface to the results of a computation, we have to take into account

A Reliable Message Delivery Protocol for Mobile Agents

Author(s)
Mudumbai Ranganathan, M Bednarek, Douglas C. Montgomery
The abstractions and protocol mechanisms that form the basis for inter-agent communications can significantly impact the overall design and effectiveness of

NIST artifact standards for fiber optic metrology

Author(s)
Paul A. Williams
The primary means of transferring fiber optic calibration metrology at the National Institute of Standards and Technology is through artifact standards called

Progress on PARCS

Author(s)
Thomas P. Heavner, Leo W. Hollberg, Steven R. Jefferts, D Meekhof, Thomas E. Parker, William D. Phillips, S L. Rolston, Hugh Robinson, Donald Sullivan, F L. Walls, Neil Ashby, W Klipstein, L Maleki, D Seidel, R Q. Thompson, S Wu, L Young, R Vessot, E Mattison, A Demarchi
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